Maintenance Manual Test Programs
3 Test Names and Functions
1. Test names and test functions are shown in Tables 2-1 and 2-2, respectively.
Table 2-1: Test Programs
1
Wafer mapping sensor movement check *Applicable to AL120-LMB12-F
FOUP-OPENER movement check
*Applicable to AL120-LMB12-LP3
A-arm vertical movement check
A-arm horizontal movement check
4
A-arm side-to-side movement check
5
Macro table vertical movement check
L-arm vertical movement check
8
F-arm vertical movement check
9
F-arm horizontal movement check
Centering sensor count check
11
Wafer mapping sensor mapping sensor height check *Applicable to AL120-LMB12-F
FOUP-OPENER mapping sensor parameter setting *Applicable to AL120-LMB12-LP3
12
A-arm insertion height check and vertical movement check
13
A-arm origin in backward/forward and side-to-side direction check
Centering transfer position check
Notch alignment adjustment
16
L-arm rotation origin sensor position check
17
F-arm horizontal origin sensor position check
19
Notch sensor and wafer sensor check
20
Stage lock and observation window lock movement check.
23
24
Wafer unloading position adjustment
26
Software version, error log display and operation settings