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General| Category | Microscope |
|---|---|
| Series | AL120-12 Series |
| Eyepiece | WF10x/18mm |
| Objective Lens | Achromatic 4x, 10x, 40x |
| Focusing | Coaxial coarse and fine focusing |
| Illumination | LED illumination |
| Power Supply | 100-240V, 50/60Hz |
| Magnification | 40x, 100x, 400x, 1000x |
Overview of AL120 series product configurations and capabilities.
Guidelines for safe operation and handling of the equipment.
Methods to secure the equipment against seismic activity.
Explanation of safety symbols and warning labels on the device.
Procedures for equipment maintenance and proper storage.
Guidelines for selecting the correct power supply cord for safety.
Identification of key parts of the wafer loader main body.
Description and function of the optional remote controller.
Identification of components of the vacuum stage.
Steps to prepare the loader before initiating wafer transfer operations.
Instructions for moving and using the vacuum stage components.
Procedures for initiating the wafer transfer process.
Detailed steps for performing the Top Macro inspection.
Procedures for Back Macro and 2nd Back Macro inspections, including tilt angle settings.
Operation and safety for the macro inspection observation window.
Steps for transferring wafers onto the vacuum stage for inspection.
How to register defective wafers and confirm results.
Procedures for temporarily stopping, pausing, or rejecting wafers.
Instructions for unloading wafers and using the emergency stop function.
Steps required before initiating any inspection procedures.
Detailed procedure for performing microscope inspection on wafers.
Procedure for performing the Top Macro inspection on wafers.
Procedure for performing the Back Macro inspection on wafers.
Combined procedure for Back Macro and 2nd Back Macro inspections.
Combined procedure for Top Macro and Microscope inspections.
Combined procedure for Back Macro and Microscope inspections.
Combined procedure for Top Macro and Back Macro inspections.
Procedure for performing a comprehensive inspection sequence.
Specialized procedures and settings beyond standard inspections.
How to modify wafer selection during or after inspection.
Details on wafer sizes, cassette types, and inspection capabilities.
Description of inspection modes, auxiliary functions, and protective features.
Information on power, environment, dimensions, and weight of the loader.
Guide to identifying and resolving warning codes displayed by the loader.
Guide to identifying and resolving error codes displayed by the loader.
Procedures for resetting circuit breakers and using the emergency off function.
Steps for automatically unloading wafers during various fault conditions.
