29
FX-MG8156ZT,MG8156ZT-91,MG8317ZT,MG8317ZT-91
3 CH1: FIN 1V/div.
$ CH2: HOLD 5V/div.
Normal mode:
The defect part passes 800
µ
m
8 CH1: TEY 0.5V/div.
6 CH2: FEY 0.1V/div.
Normal mode: AGC after focus close
8 CH1: TEY 0.5V/div.
! CH2: SD 0.5V/div.
5ms/div.
0 SIN 1V/div. 10ms/div.
Long Search
8 CH1: TEY 1V/div.
# CH2: TEC 1V/div.
Test mode: Focus close
Tracking open
2ms/div.
6 CH1: FEY 0.2V/div.
3 CH2: FIN 0.5V/div.
Normal mode: During
AGC
1ms/div.
@ EFM 1V/div. 2µs/div.
Play
0.2s/div.
% Dout 2V/div. 5µs/div.
Play
^ LRCK 2V/div. 10µs/div. * ADRMON 1V/div. 1s/div.
Normal mode: Starting play
GND
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
1 CH1: RFO 1V/div.
$ CH2: HOLD 5V/div.
Normal mode:
The defect part passes 800
µ
m
500µs/div.
REFOUT
→
REFOUT
→
8 CH1: TEY 0.2V/div.
9 CH2: TIN 0.5V/div.
Normal mode: During
AGC
1ms/div.
REFOUT
→
REFOUT
→
GND
→
GND
→
500µs/div.