28
FX-MG8156ZT,MG8156ZT-91,MG8317ZT,MG8317ZT-91
1 RFO 0.5V/div. 0.2µs/div.
Normal mode: play
1 CH1: RFO 1V/div.
2 CH2: MIRR 5V/div.
Test mode: Tracking open
0.5ms/div.
1 CH1: RFO 1V/div.
2 CH2: MIRR 5V/div.
Normal mode: The defect part
passes 500µs/div.
0.5ms/div.
3 CH1: FIN 0.5V/div.
4 CH2: FOP 2V/div.
Test mode: No disc, Focus close
0.2s/div.
3 CH1: FIN 0.5V/div.
5 CH2: FOK 2V/div.
Normal mode: Focus close
0.2s/div.
6 CH1: FEY 0.5V/div.
7 CH2: XSI 2V/div.
Normal mode: Focus close
1ms/div.
8 CH1: TEY 0.5V/div.
9 CH2: TIN 0.5V/div.
Test mode: 32 tracks jump (FWD)
0.5ms/div.
8 CH1: TEY 0.5V/div.
9 CH2: TIN 0.5V/div.
Test mode: Single jump (FWD)
0.5ms/div.
6 CH1: FEY 0.1V/div.
3 CH2: FIN 0.2V/div.
Normal mode: Play
20ms/div.
3 CH1: FIN 0.5V/div.
0 CH2: SIN 1V/div.
Normal mode: Focus close
0.5s/div.
GND
→
GND
→
GND
→
GND
→
- Waveforms
0 SIN 0.5V/div. 0.1s/div.
Normal mode: Play
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
REFOUT
→
1 RFO 0.5V/div. 0.5µs/div.
Test mode
REFOUT
→
REFOUT
→
REFOUT
→
Note:1. The encircled numbers denote measuring pointes in the circuit diagram.
2. Reference voltage
REFOUT:2.5V