Princeton Instruments PI-MAX 3 System - Procedure for Setting up and Performing a Swept Gate Experiment (Variable Width, Variable Delay); Procedure for Setting up and Performing a Static Gate Experiment (Fixed Width, Fixed Delay); Figure 42. Single Shot Result: Fluorescence Spot, 100 Ns Width, 10 Ns Delay, Binned; Figure 43. Repetitive Gating Setup Dialog Box

Chapter 6 Gated Operation 71
Figure 42. Single Shot Result: Fluorescence Spot, 100 ns Width, 10 ns Delay, Binned Vertically
Procedure for Setting up and Performing a Swept Gate Experiment
(Variable Width, Variable Delay):
The sequence of steps for a Swept Gate experiment with variable width and delay is
similar to the Swept Gate experiment with fixed width and variable delay but with the
following exception:
 In addition to entering differing start and end values for the Gate Delay, you would
also enter differing start and end values for the Gate Width.
Procedure for Setting up and Performing a Static Gate Experiment
(Fixed Width, Fixed Delay)
The sequence of steps for a Static Gate experiment is similar to the Swept Gate
experiment but with the following exceptions:
 The Active Mode, selected in Step 100, would be Repetitive.
 The Gate Width and Gate Delay values would be entered in the dialog shown below.
Note that the minimum gate delay from T0 to optical gate is ~10 ns:
Figure 43. Repetitive Gating Setup dialog box