EasyManuals Logo

Ametek MiniFlash FP Vision User Manual

Ametek MiniFlash FP Vision
69 pages
To Next Page IconTo Next Page
To Next Page IconTo Next Page
To Previous Page IconTo Previous Page
To Previous Page IconTo Previous Page
Page #64 background imageLoading...
Page #64 background image
58
© AMETEK, Inc.
16.3 Missing sample
Missing sample is detected when the temperature gradient difference between the oven temperature and the sample
temperature is unequal.
16.4 Instrument does not show values according to the literature
If the instrument shows results of samples that doesn’t comply with your literature do following checks.
Check the actuality of your literature.
Clean the oven surface and clean arc pins according to chapter “MAINTENANCE”
Check if the sample cup has deep scratches.
Check the parameter if they are correct.
Check if magnetic stirring is necessary for the sample.
Get sure that no contamination with residuals of other samples is present in the sample cup.
If the checks are done start a test again.
If this problem shows up repeatedly contact our local representative or Grabner Instruments directly.
16.5 Arc problems
The arc between both arc pins can’t be observed.
Clean arc pins as described in chapter “MAINTENANCE”
No arc between both arc pins but a soft ignition sound can be heard.
Please check if the arc pins are clean and without any liquid accumulation. Please clean the arc pins.
The ceramic insulation of the arc pin in the oven seems to be broken. The insulation against the oven is not
present anymore, thus the arc is deduced on the oven instead of the second arc pin.
No sample inserted

Table of Contents

Questions and Answers:

Question and Answer IconNeed help?

Do you have a question about the Ametek MiniFlash FP Vision and is the answer not in the manual?

Ametek MiniFlash FP Vision Specifications

General IconGeneral
BrandAmetek
ModelMiniFlash FP Vision
CategoryTest Equipment
LanguageEnglish

Related product manuals