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1.7. Key Features and Benefits: of Models 7700 and 7704
3-in-1 and 4-in-1 Multi-
function Compliance
Analyzers offer 500 VA AC
Hipot, DC Hipot, Insulation
Resistance and Ground Bond
tests in one DUT connection
HypotMAX 7700 combines the three most common
dielectric safety tests (AC Hipot, DC Hipot & IR test)
required by agencies such as UL, CSA, IEC, VDE,
TÜV, BABT and others into a single instrument which
takes up less rack space and enables a single DUT
connection. HypotMAX 7704 includes the same
dielectric tests along with a high current Ground Bond
test for applications requiring a test of the safety
ground circuit.
Full GPIB (IEEE 488) or
USB/RS-232 interfaces as
standard features
All the functions of the instrument can be programmed
over either interface which makes the instrument
adaptable to any type of automated production
environment.
Built in interface to control up
to two external scanners for
expansion capabilities
These optional scanner configurations are ideal for
multi-point testing of a single item or multiple product
testing. The high voltage channels of the scanner can
be set as high, low or off. The scanner also offers high
current Ground Bond testing channels for use with the
HypotMAX 7704.
A single 2 x 20 LCD display
provides a clear indication of
all test results and setup
parameters
This single easy-to-view and simple-to-interpret LCD
display allows the operator to monitor all test activity.
All setup parameters can be
adjusted through a simple
menu driven program with hot
keys to quickly access all
functions by using the front
panel
The operator is provided with an easy and safe way to
set trip currents and output voltages since all
parameters are set without high voltage activated. The
easy to follow menu ensures that the operator correctly
sets up each test mode.
Storage of up to 50 setups with
8 steps per setup
A real benefit for manufacturers that test different
products. Each setup can store up to 8 steps which can
be configured to perform any of the safety tests. In
addition, each setup can be linked to the next for
setting up as many as 400 steps in sequence.
Exclusive CHARGE LO and
RAMP HI testing features
allow for more effective DC
Hipot testing
The RAMP HI feature allows the user to set a higher
trip rate during the ramp to allow for quick charging of
the product without nuisance tripping thereby
increasing throughput when testing with DC. The
CHARGE LO provides the user with the capability to
ensure that the device under test is connected correctly.
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