Epec 5050 - Page 65

Technical Manual 5050 / MAN000539 Page 65/92
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Immunity of ESAs to electromagnetic
radiation
• Test method E/ECE Reg. No. 10, Annex 9
• Performance criterion: No degradation of ‘Immunity-related
functions'
• Sweep step: 1%, time/step: 3 s
Specification
Frequency
Range
(MHz)
Test level
Modulation
AM80% 1 kHz
20-800
30 V/m
(constant
peak)
PM
577/4600ms
800-2000
30 V/m
(constant
peak)
Classification of functional status
Class A:
All functions of a device/system perform as designed during and after exposure to disturbance.
Class B:
All functions of a device/system perform as designed during and after exposure to disturbance. However, one
or more of them can go beyond specified tolerance. All functions return automatically to within normal limits
after exposure is removed. Memory functions shall remain class A.
Class C:
One or more functions of a device/system do not perform as designed during exposure but return
automatically to normal operation after exposure is removed.
Class D:
One or more functions of a device/system do not perform as designed during exposure and do not return to
normal operation until exposure is removed and a device/system is reset by simple “operator/use” action.
Class E:
One or more functions of a device/system do not perform as designed during exposure and cannot be
returned to operation without repairing the device/system.
EN 61000-6-3 (2007)
Electromagnetic compatibility-generic emission standard
part6-3: residential, commercial and light industry
Radiated disturbance emission test
• Test method EN 55022, CISPR 16-2-3
Frequency
(MHz)
Limit value
(dBmV/m)
30 – 1000
40/47 (QP)