Intel 1000BASE-T User Manual

1000BASE-T/100BASE-TX/10BASE-T Physical Layer Compliance Tests Manual
Intel Confidential 45
100Base-TX Rise and Fall Times
12 100Base-TX Rise and Fall Times
ANSI Section 9.1.6
12.1 Test Purpose
To measure the rise and fall times of a non-scrambled bit pattern (both positive and negative
waveforms need to be measured).
12.2 Specification
“For the purposes of 9.1, the AOI signal rise is defined as a transition from the baseline voltage
(nominally zero) to either +V
OUT
or -V
OUT
. Signal fall is conversely defined as a transition from
the +V
OUT
or -V
OUT
to the baseline voltage.
The rise and fall times of the waveform shall be determined as the time difference between the 10%
and the 90% voltage levels of the signal transition, where 100% is represented by V
OUT
in
Figure 12-1.
Measured rise and fall times shall be between the limits: 3.0 ns ≤ t
rise/fall
≤ 5.0 ns.
The difference between the maximum and minimum of all measured rise and fall times shall be ≤
0.5 ns.”
1
Figure 12-1. Waveform Rise and Fall Times
2
1. ANSI X3.263-1995, p 30.
2. Based on ANSI X3.263-1995, p 29, figure 12.

Intel 1000BASE-T Specifications

General

Brand	Intel
Model	1000BASE-T
Category	Adapter
Language	English