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Measurement Parameters: Vce(sat), Vbe(sat) Collector-Emitter saturation volt-
age, Baser-Emitter saturation voltage
Application Test name: Vce(sat)-Ic 2
Application Test setup name (My Favorite Setup -> Example_AT): Vce(sat)-Ic 2
Device used in the example: MJL4281AG
Connection inside the N1259A Test Fixture: Use figure 3-3 or 3-4
Application description:
Measures Vce(sat)-Ic and Vbe(sat)-Ic characteristics and extracts Vce(sat) and Vbe
(sat) parameters at the specified Ib and Ic. SMU pulse is used for Collector current
output and Base current output.
A. Measurement Procedure: Vce(sat)-Ic 2 Application Test
-Starting from Application Test Library
This test approach starts measurements by using an Application Test Library, which
starts from the default setup parameters, and you have to customize the measure-
ment parameters depending on your requirements.
Setup and execute the test by following the next steps. The same instruction steps
are illustrated by the numbers on the "1. Starting from Application Test Library" side
of figure 3-9.
Step 1. Click the Application Test tab.
Step 2. Check the PowerBJT category.
Step 3,4. Select Vce(sat)-Ic 2 (Click the Vce(sat)-Ic 2 then click Select )
Step 5. Set the test parameters shown in figure 3-9 to an appropriate one depending
on your B1505A configuration and your test device.
The important check points are;
a. Scale parameter:
You can choose "Linear" or "LOG" sweep selection for the collector and
the base current sweep. The measurement is typically made in a few dec-
ades of wide measurement range in the collector and the base current,
and LOG10 or LOPG25 which measures 25 points in a decade of sweep
span would be a reasonable choice.
b. Collector SMU setup
c. IbIcRatio parameter: Set the Ib sweep parameter with the following for-
mula: Ib=Ic/IbIcRatio
d. Set Ic and Vc test condition:
e. Set the collector current to extract Vce(sat) extraction: Ic@VceSat
f. Base SMU setup
g. Set the base current to extract Vbe(sat) extraction: Ib@VbeSat and set
base pulse width
3-1-3. Vce(sat) and Vbe(sat) versus Ic measurement
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