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LeCroy WaveRunner XI Series User Manual

LeCroy WaveRunner XI Series
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WAVERUNNER XI SERIES
histmaxp HistogramMaximumPopulation
ed
Definition:
The count (vertical value) of the highest population bin in a histogram.
Each bin between the parameter cursors is examined for its count. The highest count is return
as maxp.
Description:
Example:
Here, maxp is 14.
histmode HistogramMode
Definition:
The value of the highest population bin in a histogram.
Description:
Each bin between the parameter cursors is examined for its population count. The leftmost bin
with the highest count found is selected. Its center value is returned as mode.
Example:
Here, mode is 150 mV.
histrange HistogramRange
omputes the difference between the value of the rightmost and that of the leftmost populated
bin.
Description:
The rightmost and leftmost populated bins are identified. The difference in value between the two
is returned as the range.
Example:
Definition:
C
In this example, range is 2 mV.
92 WRXi-OM-E Rev C

Table of Contents

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LeCroy WaveRunner XI Series Specifications

General IconGeneral
BrandLeCroy
ModelWaveRunner XI Series
CategoryTest Equipment
LanguageEnglish

Summary

Introduction and Specifications

How to Use On-line Help

Explains accessing and navigating the instrument's help system and documentation.

Technical Support and Updates

Information on obtaining technical assistance and keeping instrument firmware updated.

Specification Details

Details on the instrument's performance characteristics, including system capabilities.

Safety Requirements and Front Panel Controls

Safety Symbols and Operating Environment

Identifies safety symbols and specifies operational environmental parameters.

Cooling, Power, and Calibration

Requirements for cooling, power supply, and instrument calibration procedures.

Front Panel Controls Overview

Description of the physical buttons and knobs on the instrument's front panel.

Vertical, Zoom, and Special Controls

Details on controlling vertical settings, zoom functions, and special features.

On-Screen Interface and Operation

Toolbars, Icons, and Dialog Boxes

Explanation of the graphical user interface elements and their functions.

Trace Annotation and Setup

How to add descriptive labels to waveforms and configure trace display.

Installation and Connections

Installation Procedures

Steps for initial setup, including power-up and hardware connections.

Software and Options Management

Procedures for managing instrument software, status, and adding new options.

External Monitor Setup

Instructions for connecting and configuring an external display.

Signal Connection and Probes

Guidance on connecting signals, using probes, and auxiliary outputs.

Sampling Modes and Acquisition Settings

Sampling Modes Overview

Explanation of different sampling techniques like WaveStream, Real Time, and Sequence.

Vertical and Timebase Settings

Configuration of vertical gain, position, coupling, and timebase parameters.

Triggering System Operations

Setup considerations, modes, and types of triggers available for signal capture.

Display Formats and Persistence

Options for waveform display, including persistence and trace formatting.

Data Management and Analysis Tools

Save and Recall Functions

Procedures for saving and recalling instrument settings, waveforms, and screen images.

Printing and File Management

Options for outputting data, printing, and managing files on the instrument.

Track Views and Histograms

Tools for visualizing data trends and analyzing waveform parameter distributions.

Waveform Measurements

Techniques and tools for measuring signal properties using cursors and parameters.

Analysis Tools: Pass/Fail and Mask Tests

Methods for automated testing and limit checking of signal parameters.

Utilities and Customization

Utilities Overview

Access to system status, remote communication, hardcopy, file management, and preferences.

Customization Capabilities

Using external programs like Excel, MATLAB, and VBScript for advanced analysis.

Custom DSO and LabNotebook

Features for creating custom instrument setups and documenting measurements.

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