960L Multi-Channel Digital Effects System Service Manual
6-40
Memory Test:
This test performs a non-destructive memory test on all memory locations of the DRAM above the memory
locations where the Boot ROM was copied (from C0008000h to C8000000h). The test first writes 55555555
(hex) into these memory locations of the DRAM, then the same memory locations are read to verify the
data written in these locations is correct. This write/read sequence is also performed using the (hex) values
FFFFFFFF and a Walking 1's pattern. Refer to the table below for the hex to binary conversion of the data
patterns:
HEX
VALUE:
M L
S S
B BINARY CONVERSION: B
55555555 0101 0101 0101 0101 0101 0101 0101 0101
FFFFFFFF 1111 1111 1111 1111 1111 1111 1111 1111
1 0000 0000 0000 0000 0000 0000 0000 0001
2 0000 0000 0000 0000 0000 0000 0000 0010
4 0000 0000 0000 0000 0000 0000 0000 0100
8 0000 0000 0000 0000 0000 0000 0000 1000
10 0000 0000 0000 0000 0000 0000 0001 0000
20 0000 0000 0000 0000 0000 0000 0010 0000
40 0000 0000 0000 0000 0000 0000 0100 0000
80 0000 0000 0000 0000 0000 0000 1000 0000
100 0000 0000 0000 0000 0000 0001 0000 0000
200 0000 0000 0000 0000 0000 0010 0000 0000
400 0000 0000 0000 0000 0000 0100 0000 0000
800 0000 0000 0000 0000 0000 1000 0000 0000
1000 0000 0000 0000 0000 0001 0000 0000 0000
2000 0000 0000 0000 0000 0010 0000 0000 0000
4000 0000 0000 0000 0000 0100 0000 0000 0000
8000 0000 0000 0000 0000 1000 0000 0000 0000
10000 0000 0000 0000 0001 0000 0000 0000 0000
20000 0000 0000 0000 0010 0000 0000 0000 0000
40000 0000 0000 0000 0100 0000 0000 0000 0000
80000 0000 0000 0000 1000 0000 0000 0000 0000
100000 0000 0000 0001 0000 0000 0000 0000 0000
200000 0000 0000 0010 0000 0000 0000 0000 0000
400000 0000 0000 0100 0000 0000 0000 0000 0000
800000 0000 0000 1000 0000 0000 0000 0000 0000
1000000 0000 0001 0000 0000 0000 0000 0000 0000
2000000 0000 0010 0000 0000 0000 0000 0000 0000
4000000 0000 0100 0000 0000 0000 0000 0000 0000
8000000 0000 1000 0000 0000 0000 0000 0000 0000
10000000 0001 0000 0000 0000 0000 0000 0000 0000
20000000 0010 0000 0000 0000 0000 0000 0000 0000
40000000 0100 0000 0000 0000 0000 0000 0000 0000
80000000 1000 0000 0000 0000 0000 0000 0000 0000
When a Memory Test failure is encountered, the test will stop and loop continuously at the failed address
location. The address where the error occurred, along with the data sent, and the data received is sent to
the LCD display and also to the Debug Port.
NOTE: The Memory Test will run for approximately 2 minutes. The LARC2 will return to the 'Interactive
Diagnostics' menu when the Memory Test is complete.
Repetitive Test:
This test was designed to exercise the LARC2 hardware during the Burn In cycle of the Manufacturing Test
process. Refer to the following instructions for the execution of the Repetitive Test.
To Next Page
Loading...
