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Metrohm FOSS NIRS XDS MultiVial Analyzer - Page 82

Metrohm FOSS NIRS XDS MultiVial Analyzer
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standard. These peaks are used to set the “Instrument Wavelength Profile,” and one peak is used for
bandwidth calculation.
The wavelengths used for the instrument wavelength profile are well-defined, stable peaks in the
wavelength standard. These are the same peaks used during Instrument Calibration. Wavelength
Certification is a verification that the peaks are in correct positions, and that the peak positions are
consistent over time. Note that both tests use the wavelength standard at the sample plane, where
actual sample measurement is done.
Wavelength Certification is an excellent method to test whether Instrument Calibration needs to be
re-run. If the original settings in Instrument Calibration have drifted, a message will be displayed in
Wavelength Certification that Instrument Calibration should be re-run. Click on the Instrument
Calibration tab to see the results:

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