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Metrohm FOSS NIRS XDS MultiVial Analyzer User Manual

Metrohm FOSS NIRS XDS MultiVial Analyzer
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The wavelength peaks used here are not the NIST peak positions, though they are within +/- 1.0nm
of the NIST peaks. The peaks used in Instrument Calibration are the peak positions used to assure
transferability of the XDS instrument, and are defined based upon tests of many XDS instruments.
Note that Performance Test measures peak positions of internal reference materials, and these
positions are used as a preliminary method to maintain wavelength measurement. The final
measurement is made at the sample plane, using the external standard. As discussed under
Performance Test, the internal reference materials are not traceable, and are only used as an internal
method of maintaining correct wavelength measurement prior to measurement of the external
wavelength standard.
If the test has passed, the user should click the cursor on the tabular display, go to the File menu, and
click Print to keep a copy of the report. It is saved in the Diagnostic Database for future recall. See the
Vision manual for a full explanation.

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Metrohm FOSS NIRS XDS MultiVial Analyzer Specifications

General IconGeneral
BrandMetrohm
ModelFOSS NIRS XDS MultiVial Analyzer
CategoryMeasuring Instruments
LanguageEnglish

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