Safety Manual for MPC5777M, Rev. 1.1
Address decoding coverage
NXP Semiconductors68
— DecD – A<12:10>
— DecC – A<9:8>
— DecB – A<7:6>
— DecA – A<5:4>>
• Column selection
— DecE – A<3:0>
Having these parameters in mind the user, starting from the victim address, shall build a list of the locations
which shall be read by the self-test.
For this example the list of locations to be read is shown in Table 5 (Example of back-to-back read to
implement test). All locations in grey shall be read. Some locations have an associated number; this
number is the read order. Location #1 shall be read first, location #2 second, and so on. The order is not
important for location without any number specified.
In such example the SRAM locations to be read are:
1. 100.01.00.11.110b
2. 011.10.11.00.110b
3. 011.10.11.00.001b
4. and so on.
Next section describes how to compile such a list.
Table 5. Example of back-to-back read to implement test
DecE
DecD DecC DecB DecA 000 001 010 011 100 101 110 111 Description
000 10 11 00
DecD combination
001 10 11 00
DecD combination
010 10 11 00
DecD combination
011 10 01 00
DecB combination
011 10 11 00
DecB combination
011 00 11 00
DecC combination
011 01 11 00
DecC combination
011 10 11 00
6 4 10 14 16 12 2 7 Ah : victim address (red cell)
011 11 11 00
DecC combination
011 10 11 01
DecA combination
011 10 11 10
DecA combination
011 10 11 11
DecA combination
100 01 00 11
5 3 9 13 15 11 1 7 Complementary address
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