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optris CTlaser LT - Characteristic Emissivity

optris CTlaser LT
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9.3 Characteristic emissivity
In case none of the methods mentioned above help to determine the emissivity you may use the emissivity
table Appendix A and Appendix B. These are average values only. The actual emissivity of a material
depends on the following factors:
temperature
measuring angle
geometry of the surface
thickness of the material
constitution of the surface (polished, oxidized, rough, sandblast)
spectral range of the measurement
transmissivity (e.g. with thin films)
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