Measurements
R&S
®
FSW
203User Manual 1173.9411.02 ─ 19
Although a margin functionality is not available for the limit check, a margin (threshold)
for the peak values to be displayed in the Result Summary can be defined in the "List
Evaluation" settings. For details see chapter 5.6.5.7, "List Evaluation (Results Configu-
ration)", on page 224.
5.6.4.3 Fast SEM Measurements
In order to improve the performance of the R&S FSW for spectrum emission mask
measurements, a "Fast SEM" mode is available. If this mode is activated, several con-
secutive ranges with identical sweep settings are combined to one sweep internally,
which makes the measurement considerably faster. The displayed results remain
unchanged and still consist of several ranges. Thus, measurement settings that apply
only to the results, such as limits or transducer factors, can nevertheless be defined
individually for each range.
Prerequisites
"Fast SEM" mode is available if the following criteria apply:
●
The frequency ranges are consecutive, without frequency gaps
●
The following sweep settings are identical (for details see chapter 5.6.5.1, "Sweep
List", on page 209):
– Filter Type
– RBW
– VBW
– Sweep Time Mode
– Reference Level
– Rf Attenuation Mode
– RF Attenuation
– Preamplification
Activating Fast SEM mode
"Fast SEM" mode is activated in the sweep list (see chapter 5.6.5.1, "Sweep List",
on page 209) or using a remote command. Activating the mode for one range auto-
matically activates it for all ranges in the sweep list.
Remote command:
[SENSe:]ESPectrum<sb>:HighSPeed on page 733
Spectrum Emission Mask (SEM) Measurement
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