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General| Brand | Sequoia |
|---|---|
| Model | FastTracer |
| Category | Measuring Instruments |
| Language | English |
Details warranty duration for private persons and companies, adhering to Decree Law no. 24 of 2-2-2002.
Provides website and email for further information and assistance from Sequoia IT.
Advises users to read the disclaimer and legal notes, as using FastTracer implies automatic acceptance of terms.
Declares FastTracer conformity with EMC and CE marking directives according to ISO/IEC Guide 22 and EN45014.
Explains the WEEE symbol for waste disposal and outlines copyright protections for manual content.
Introduces FastTracer as a system for vibration-based diagnostics of machines and structures.
Outlines required IT and vibration analysis knowledge and describes the manual's five-chapter structure.
Details the FastTracer solution, including acquisition device and software for data display and processing.
Provides a diagram and detailed specifications such as acceleration range, frequency band, dimensions, and weight.
Describes the time-trend analysis of x-y-z acceleration components at the sensor application point.
Outlines two diagnostic levels: condition monitoring (RMS level) and cause inquiry (FFT analysis).
Explains the integration of FTAnalyzer and Esplora 3D for data analysis and diagnostics.
Highlights benefits like reduced inspections, fewer unexpected stops, and maximized maintenance efficiency.
Guides on positioning the sensor and starting the FTAnalyzer or Esplora 3D software.
Lists minimum, standard, and suggested system requirements for processor, RAM, hard disk, and operating systems.
Provides step-by-step instructions for installing the FTAnalyzer software, recommending to shut down other programs.
Details the installation process for Esplora 3D, including prerequisites and procedural steps.
Emphasizes the importance of correct sensor positioning and fastening for accurate measurements.
Advises setting the sensor close to vibration sources and using magnetic adapters or adhesives for secure fastening.
Addresses common issues like software recognition, startup problems, device limits, and technical assistance.
Defines FTAnalyzer as software for display, storage, and processing of FastTracer device measurements.
Explains how FTAnalyzer processes and displays acquired values in real-time or off-line, supporting multiple devices.
Highlights using FTAnalyzer for condition monitoring by comparing measures over time and processing stored data via File Devices.
Covers analyzing measures in time domain, frequency domain, or both, with options for diagnostics and research.
Describes the FTAnalyzer interface, including toolbars, Devices List, and Graphics areas for user interaction.
Provides instructions on how to launch the FTAnalyzer application via the Windows Start menu.
Explains the two main types of Graphics areas: time domain (oscilloscope) and frequency domain (spectrum analyzer).
Details the procedure for displaying and positioning multiple Graphics areas within the FTAnalyzer screen view.
Describes the Devices view for connected devices and File Devices for data stored in files.
Explains how to refresh the device list and the acronyms used for devices and file devices.
Details the FTAnalyzer menu options and how to access Global Settings for parameter adjustments.
Describes various parameters for oscilloscope and spectrum analysis, including scale types and limits.
Introduces the different toolbars and their associated icons for quick function access in FTAnalyzer.
Explains the functionality of the Trigger, Device, Tool, and Action toolbars for measurement control and data handling.
Guides users on how to start a new measurement view via the Action Toolbar or Menu Bar.
Details selecting 'TIME' for time domain measurements and displaying results in the oscilloscope Graphics area.
Explains signal types like Axes, Axes & Modules, Rms, and the 256-measure buffer for RMS calculation.
Describes the step-by-step algorithm used by FTAnalyzer to calculate the instantaneous RMS value.
Covers adjusting Y Scale, Y Offset, X Scale, and accessing advanced settings for event selection and filtering.
Details selecting displayed tracks and applying low/high pass filters for time domain acquisition measures.
Guides on selecting 'FREQUENCY' for spectral analysis and choosing the event for frequency spectrum examination.
Lists signal types for frequency analysis: FFT Acceleration, FFT Velocity, and FFT Displacement.
Explains parameters for frequency display, including axis scales, FFT points, and frequency resolution calculation.
Allows selection of analyzed events, colors, and line styles for frequency spectrum display.
Details setting Y scale type (linear/dB), measure units for axes, and dB reference value.
Explains the algorithm for evaluating total vibration value within a defined bandwidth.
Enables data acquisition synchronization with specific vibrational events based on user-defined trigger levels.
Details setting trigger levels for acceleration components and enabling the function on multiple axes with OR logic.
Guides on choosing measurement types (e.g., FFT Acceleration) for triggered data acquisition.
Explains how to configure trigger parameters like Level, Slope, and Stop Time in the trigger toolbar.
Describes processing acquired measures as virtual File Devices and the process of measure recording.
Outlines the default file naming convention including date and time information.
Details the keys used for controlling the recording state: starting and stopping measures.
Provides steps for creating a virtual device from a stored file to load and process measures.
Shows the overview of a performed measurement and related information from a File Device.
Guides on opening new views to reproduce or analyze measures stored in a File Device.
Explains how to extract specific intervals of measures from a File Device to another file.
Details the process of exporting acquired or saved measures to a text file via a pop-up menu.
Allows setting start time, end time, and associated samples for exporting data to a text file.
Describes the output file structure, including sampling speed and data organization in columns.
Guides on exporting analyzed measures to Microsoft Excel files for further analysis and document creation.
Enables selection of the number of points to be exported to Microsoft Excel.
Details the columns provided in the Microsoft Excel spreadsheet for measures and diagrams.
Provides recommendations for enabling external data macros and connections in Microsoft Excel for data import.
Instructs on handling Microsoft Excel protection notices by enabling content or options.
Explains how to save and restore custom view configurations using the Perspective menu.
Explains FTEditor's role in defining cause-fault relations and creating diagnostics paths for machines.
Illustrates the interaction between FTAnalyzer, FTEditor, and Esplora 3D, defining roles of expert and operator.
Presents the conceptual model of a machine archive (Model Database) used for monitoring with FTEditor.
Provides instructions on how to start FTAnalyzer and subsequently access FTEditor.
Details the process of creating a new model or archive containing sets of tests for machine condition monitoring.
Explains how to define condition monitoring tests and add them to a specific machine model archive.
Covers editing test models, highlighting areas on machine images, and adding sensor positioning images.
Guides on defining the specific measures to be carried out for each test within a model.
Details setting measure parameters, alarm thresholds, and related messages for operator guidance.
Explains how to use the graphics area to simulate measures and check the efficiency of set parameters.
Defines the fields for thresholds: Name, Type, Frequency Min/Max, Value, Message, and Action.
Lists options for measure simulation, including refreshing the device list and selecting the device.
Describes exporting the database created with FTEditor for use with the Esplora 3D software.
Designed for maintenance operators to perform predictive diagnosis by comparing threshold values.
Introduces the fundamental concepts of Model Instance and Model DB that Esplora 3D is based on.
Explains how machines are identified as Model Instances based on parameters like serial number and identification.
Defines Model DB as an archive for a specific machine family, including tests and fault handling guidelines.
Provides the initial steps to start the Esplora 3D software via the Windows Start menu.
Presents the main view options: Test Model Instance for diagnostics or Browse Model Instance Tests Reports.
Guides on loading the relevant machine archive (Model DB) before performing diagnostics.
Details selecting models and instances from the database to carry out machine diagnosis procedures.
Explains the 'Models' and 'Instances' sections in the selection view and their respective content.
Provides instructions on creating a new machine instance by filling in essential identification parameters.
Initiates diagnostic tests on a selected machine instance, showing machine images and highlighted areas.
Guides the operator with instructions and images, then prompts for acquisition device selection before test execution.
Explains how test results (success or failure) are displayed and how to handle failure messages.
Allows users to view stored test results and reports within a virtual test archive.
Details the functions available in the File, View, and Help menus of the Esplora 3D software.
Lists cited academic and technical resources related to condition monitoring and vibration analysis.
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