76 11 INTERFACE
• HH and LL ratio setting
Can be set every 10% from 10 to 90%.
Checksum G 2 digit integer 00 FF
Data from “#” to “:” is summed up and its
two’s complement is taken.
• Leak rate limit setting (HI limit and LO limit)
#SS_00_CC_Command_±VVVV.VVV:GG<CR>
Data V
±0000.000 ±0999.000
Checksum G 2 digit integer 00 FF
summed up and its two’
• Timer and Equivalent internal volume or leak coefficient setting
#SS_00_CC_Command_VVVV.VVV:GG<CR>
Checksum G 2 digit integer
00 FF
summed up and its two’
Example: Writing command “WDET_0000.500” programs DET timer 0.5s.
Limit ratio can be set every 10% from 10 to 90% of the leak rate limits (Hi and
Lo limits). The tester transmits error if other numbers are received.
Setting will be ineffective, and tester transmits NAK code every 0.1 seconds ΔP
exceeds ±1000 Pa while mL/min is selected for leak rate unit.
Set the END timer 0.2 seconds and DL1, DL2, BAL and DET timers 0.1 second
or longer. Values are rounded off to one decimal place. Value larger than
999.8 will be infinite.
Writing “WBLO_-0500.000” sets the leak rate limit –500 Pa.
Setting will be ineffective, and tester transmits NAK code ΔP exceeds
±1000 Pa while mL/min is selected for leak rate unit.
When memory switch 24 is set to 0, the maximum values for CHG
(pressurization) time and STB (stabilization) time are 9999.000. If the time
value exceeds 1000.000, the digits after the decimal point are truncated. If the
value exceeds 6000.000, it is set as infinite with no timeout. In this case, the
maximum value is forced to 9999.000.
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