Eaton Cutler-Hammer FP-5000 - Self Test Event Cause Table

IL17569
Page 12-10
Effective June, 2001
As described in Section 12.1, the FP-5000 does a series of self diagnostic checking. If any self test should fail, the event is logged automati-
cally in the event log. See Table 12.11 for a complete list of self test event causes.
Table 12.11 Self Test Event Cause Table
Cause Cause Description Value Given
Bt Flash Err Boot Flash Checksum Failure No value associated with this cause
ProgFlash Err Program Flash Checksum Failure No value associated with this cause
Ext RAM Fail External RAM Error Bad RAM Address
TPU RAM Fail Internal TPU RAM Error Bad Internal TPU RAM Address
Analog In Err Analog to digital conversion error No value associated with this cause
Set Warning A recoverable Settings (setpoint) No value associated with this cause
error has occurred
Set Failure A non-recoverable Settings (setpoint) No value associated with this cause
error has occurred
Display Warn Display Warning – read back test failed No value associated with this cause
RelNotCalibra No Calibration constants are present No value associated with this cause
RAM Batt Warn The non-volatile RAM Battery is low No value associated with this cause
Clock Warning The real time clock has failed No value associated with this cause
Test Mode The Test Mode has been entered or exited Enter or Exit
EEPROM Warning The EEPROM has failed No value associated with this cause
CalibrateWarn A recoverable Calibration error has occurred No value associated with this cause
CalibrateFail A non-recoverable Calibration No value associated with this cause
error has occurred