Endress+Hauser analytikjena SPECORD PLUS - Specifications; Optical System Performance; SPECORD 50 PLUS Specifications

SPECORD PLUS Specifications
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10 Specifications
10.1 Physical/optical performance data
10.1.1 Optical system
Spectrometer sys-
tem
Monochromator with imaging grating and aspherical, quartz-coated
optics
Internal holmium oxide filter
Detector Two silicon photo diodes
Peltier-controlled for SPECORD 210 and 250 PLUS
Sample position Additional measuring location for opaque samples
Large selection of accessories for optimized positioning of solid, liquid
and gaseous samples
Light source Combination of halogen and deuterium lamp
Lamp replacement adjustable between 300 and 450nm
10.1.2 SPECORD 50 PLUS
Optics Double-beam spectrophotometer with split
beam technology
Wavelength range 190 to1100 mm
Photometric display range -9to9 A
Photometric measuring range -3to3 A
Spectral bandwidth 1.4 nm
Spectral resolution capability for
toluol/hexane at 20–25°C
1.6to1.8
Wavelength accuracy
(deuterium line at 486nm)
±0.2 nm
Wavelength accuracy
(deuterium line at 656.1nm)
±0.1 nm
Wavelength accuracy
(holmium oxide filter at 360.9nm)*
± 0.5 nm
Wavelength reproducibility
(holmium oxide filter at 360.9nm)*
≤0.02 nm
Transmission zero point
(200–1000nm)
±0.05 %T
VIS photometric accuracy
(Hellma neutral glass filter F4 at 546nm)*
±0.003 A
UV photometric accuracy
(potassium dichromate)*
±0.010 A
Photometric accuracy
(potassium dichromate at 430nm)*
±0.010 A
Photometric reproducibility
(Hellma neutral glass filter F4 at 546nm)*
≤0.0005 A
Scattered light at 198nm (KCl)** ≤0.3 %T
Scattered light at 220nm (Nal) ≤0.03 %T
Scattered light at 240nm (Nal) ≤0.03 %T