Endress+Hauser analytikjena SPECORD PLUS - SPECORD 200 PLUS Specifications

Specifications SPECORD PLUS
40
Scattered light at 340nm (NaNO
2
) ≤0.02 %T
Baseline noise at 500nm (RMS) ≤0.0001 A
Baseline deviation (200–1000nm) ±0.0005 A
Long-term stability at 500nm ±0.0005 A/h
Uncorrected 100% transmission line
(min./max.; 200–1000nm)
300to900 %T
Logging speed Up to 12000 nm/min
Minimum integration time 0.001 s
Minimum data interval 0.02 nm
* Taking into account the tolerances of the standard solutions used
** Merck® 1.08164.0001
10.1.3 SPECORD 200 PLUS
Optics Double-beam spectrophotometer with fixed
slit
Wavelength range 190 to1100 mm
Photometric display range -9to9 A
Photometric measuring range -3to3 A
Spectral bandwidth 1.4 nm
Spectral resolution capability for
toluol/hexane at 20–25°C
1.6to1.8
Wavelength accuracy
(deuterium line at 486nm)
±0.2 nm
Wavelength accuracy
(deuterium line at 656.1nm)
±0.1 nm
Wavelength accuracy
(holmium oxide filter at 360.9nm)*
± 0.5 nm
Wavelength reproducibility
(holmium oxide filter at 360.9nm)*
≤0.02 nm
Transmission zero point
(200–1000nm)
±0.05 %T
VIS photometric accuracy
(Hellma neutral glass filter F4 at 546nm)*
±0.003 A
UV photometric accuracy
(potassium dichromate)*
±0.010 A
Photometric accuracy
(potassium dichromate at 430nm)*
±0.010 A
Photometric reproducibility
(Hellma neutral glass filter F4 at 546nm)*
≤0.0005 A
Scattered light at 198nm (KCl)** ≤0.3 %T
Scattered light at 220nm (Nal) ≤0.03 %T
Scattered light at 240nm (Nal) ≤0.03 %T
Scattered light at 340nm (NaNO
2
) ≤0.02 %T
Baseline noise at 500nm (RMS) ≤0.0001 A
Baseline deviation (200–1000nm) ±0.0005 A
Long-term stability at 500nm ±0.0005 A/h
Uncorrected 100% transmission line
(min./max.; 200–1000nm)
60to160 %T