Software Overview
The way that light reflects off of a thin film is determined by the characteristics of the film, such as
its thickness, optical constants, and roughness. The F20 is able to determine thin-film char-
acteristics by first carefully measuring the amount of light reflected from the thin film over a range
of wavelengths (i.e., by measuring the reflectance spectrum), and then analyzing this data by com-
paring it to a series of calculated reflectance spectra. Most of the features of the FILMeasure soft-
ware that runs the F20 can be divided into reflectance acquisition and reflectance analysis
functions. The following pages outline the main features of the FILMeasure software.
The basic steps for any F20 measurement are selecting and editing the film structure, taking a base-
line measurement, and then making and evaluating the measurement. The details of each of these
steps are explained below, followed by descriptions of other FILMeasure functions.
Measure Tab
1. Standard Windows File menu for saving and retrieving data, printing, etc.
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