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Intel 1000BASE-T User Manual
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1000BASE-T/100BASE-TX/10BASE-T Physical Layer Compliance Te
sts Manual
Intel Confidential
49
100Base-T
X Rise and F
all Times
Figure 12
-5. Negati
ve Rise Time
Measur
ement
Note:
The rise tim
e (
∆
t) in
Figure
12-5
is measured to be 3.68 ns.
Figure 12-6. Negative F
all Time Measurement
Note:
The fall time (
∆
t) in
Figure
12-6
is measured to be 3.83 ns.
58
60
Table of Contents
Table of Contents
5
Introduction
11
Reference Documents
11
Basic Concepts
11
Calibration
11
Triggering
12
Signal with an Ambiguous Trigger Level
12
Signal Does Not Appear
12
Displaying Waveforms
12
Required Test Equipment
14
Required Test Fixtures
15
Required Software and Data Patterns
15
PHY Conformance Tests
16
1000BASE-T Peak Differential Output Voltage and Level Accuracy
19
Test Purpose
19
Specification
19
Peak Differential Output Voltage and Level Accuracy
19
Test Equipment
20
Test Fixtures
20
Test Procedure
20
1000BASE-T Maximum Output Droop
25
Test Purpose
25
Specification
25
Maximum Output Droop
25
Test Equipment
26
Test Fixtures
26
Test Procedure
26
1000BASE-T Receiver Differential Input Signals (Bit Error Rate)
29
Test Purpose
29
Specification
29
Test Equipment
29
Test Fixtures
29
Test Procedure
29
Calculating Bit Error Rate (BER)
30
1000BASE-T Alien Crosstalk Noise Rejection
31
Test Purpose
31
Specification
31
Test Equipment
31
Test Fixtures
31
Test Procedure
31
1000BASE-T MDI Return Loss
33
Test Purpose
33
Specification
33
Test Equipment
33
Test Fixtures
33
Test Procedure
33
1000BASE-T MDI Common-Mode Output
37
Test Purpose
37
Specification
37
Test Equipment
37
Test Fixtures
37
Test Procedure
37
100BASE-TX Differential Output Voltage (UTP)
41
Test Purpose
41
Specification
41
Test Equipment
41
Test Fixtures
42
Test Procedure
42
100BASE-TX Waveform Overshoot
45
Test Purpose
45
Specification
45
Test Equipment
46
Test Fixtures
46
Test Procedure
46
100Base-TX Signal Amplitude Symmetry
49
Test Purpose
49
Specification
49
Test Procedure
49
11 100Base-TX Transmitter Return Loss
51
Test Purpose
51
Specification
51
Test Equipment
51
Test Fixtures
51
Test Procedure
51
100Base-TX Rise and Fall Times
55
Test Purpose
55
Specification
55
Test Equipment
56
Test Fixtures
56
Test Procedure
56
100Base-TX Duty Cycle Distortion (DCD)
61
Test Purpose
61
Specification
61
Test Equipment
61
Test Fixtures
62
Test Procedure
62
14 100Base-TX Transmit Jitter
67
Test Purpose
67
Specification
67
Test Equipment
67
Test Fixtures
67
Test Procedure
67
100Base-TX Differential Input Signals (BER)
69
Test Purpose
69
Specification
69
Test Equipment
69
Test Fixtures
70
Test Procedure
70
Calculating Bit Error Rate (BER)
70
100Base-TX Receiver Return Loss
73
Test Purpose
73
Specification
73
Test Equipment
73
Test Fixtures
73
Test Procedure
73
10Base-T Peak Differential Output Voltage on TD Circuit
77
Test Purpose
77
Specification
77
Test Equipment
77
Test Fixtures
77
Test Procedure
78
18 10Base-T Harmonic Content
81
Test Purpose
81
Specification
81
Test Equipment
81
Test Fixtures
81
Test Procedure
81
10Base-T TD Circuit Impedance (Transmitter Return Loss)
83
Test Purpose
83
Specification
83
Test Equipment
83
Test Fixtures
83
Test Procedure
83
10Base-T TD Circuit Common-Mode Output Voltage
87
Test Purpose
87
Specification
87
Test Equipment
87
Test Fixtures
87
Test Procedure
87
10Base-T Transmitter Output Timing Jitter with Cable Model
91
Test Purpose
91
Specification
91
Test Equipment
91
Test Fixtures
91
Test Procedure
91
10Base-T Transmitter Output Timing Jitter Without Cable Model
95
Test Purpose
95
Specification
95
Test Equipment
95
Test Fixtures
95
Test Procedure
95
10Base-T RD Receiver Circuit Signal Acceptance Test (BER)
99
Test Purpose
99
Specification
99
Test Equipment
99
Test Fixtures
100
Test Procedure
100
Calculating Bit Error Rate (BER)
100
10Base-T RD Circuit Differential Input Impedance (Receiver Return Loss)
103
Test Purpose
103
Specification
103
Test Equipment
103
Test Fixtures
103
Test Procedure
103
1000Base-T Test Fixtures and Calibration Load Fixtures
107
Fixture 40-25
107
Fixture 40.6.1.1.1.A - Differential Breakout Cable
108
Fixture 40.6.1.1.1 - Test Cable
108
Fixture 40.8.3.1.A
110
Fixture 40.8.3.1.B
110
Fixture 40.8.3.1.C
111
Fixture 40-28A
111
Fixture 40-28B
112
Fixture 40-32
112
Test Fixture Construction Tips and Information
115
General Test Fixture Construction Guidelines
115
Connector Pin-Out, and Ethernet Cable Wire Assignment
116
Worst-Case Cable for Jitter
117
Constructing the 120-Ohm Impedance Segments (L1 and L3)
117
Other Test Fixtures
121
100 Ohm UTP Test Load
121
100Base-TX Balun Test Fixture
121
Open Circuit Inductance Test Fixture
121
Receiver Common-Mode Rejection Test Fixture
122
10Base-T Balun Test Fixture
123
Common-Mode Output Voltage Test Circuit (Fixture 14-14)
123
10BASE-TX 14_7 Twisted-Pair Model
124
Building and Testing UTP LAN Cables to Insertion Loss Specifications
125
Purpose
125
Network Analyzer Setup and Calibration
125
Measuring the Insertion Loss of the Twisted Pair Cable
126
Alternate Insertion Loss Measurement Techniques
127
Reducing Measurement Error by Avoiding Cable Bending
129
Troubleshooting Guide
133
Test Problems
133
Oscilloscope Setups
133
Network Analyzer Setups
134
Conformance Problems
134
Differential Output Voltage (UTP) (ANSI Specification 9.1.2.2)
134
Overshoot (ANSI Specification 9.1.3)
135
Amplitude Symmetry (ANSI Specification 9.1.4)
135
Return Loss (ANSI Specifications 9.1.5 and 9.2.2)
136
Rise and Fall Times (ANSI Specification 9.1.6)
136
Open Circuit Inductance (ANSI Specification 9.1.7)
136
Duty Cycle Distortion (ANSI Specification 9.1.8)
137
Transmit Jitter (ANSI Specification 9.1.9)
138
Differential Input Signals (ANSI Specification 9.2.1)
139
Receiver Common Mode Rejection (ANSI Specification 9.2.3)
139
Manual Register Settings
141
82540 And 82546 Families
141
82541 And 82547 Families
142
82544 Family
142
100Base-TX Test Procedure for the 82544 Chip
145
Introduction
145
Equipment Used for this Procedure
145
Specification 9.1.2.2 - Differential Output Voltage (UTP)
146
Test Case
146
Test Purpose
146
Specification
147
Test Equipment
147
Test Fixtures
147
Test Procedure
147
Specification 9.1.6 - Rise/Fall Times
150
Test Purpose
150
Specification
150
Test Equipment
150
Test Fixtures
151
Test Procedure
151
Notes for Using Pulse-Width Triggering
151
10% and 90% of Positive Peak Voltage Calculations
156
9.1.6 Rise and Fall Times
157
Test Case
158
Test Purpose
158
Specification
158
Test Equipment
158
Test Fixtures
158
Specification 9.1.8 - Duty Cycle Distortion (DCD)
158
Test Procedure
159
Generic Oscilloscope Settings
159
Duty Cycle Distortion Data
161
4
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Intel 1000BASE-T Specifications
General
Brand
Intel
Model
1000BASE-T
Category
Adapter
Language
English
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