Troubleshooting
2-30
Test 202.5 — Baseline for test 202.6
Type
Circuit Exercise
Fault message None
Description Integration time is set up with I13 and I0 high and all other I lines low. This test used the same
circuit setup as test 202.1. A zero reading is acquired and stored as baseline value for test 202.6.
Drawing reference Analog Board; 2002-100
A/D Converter; 2002-160
Bit patterns
Test 202.6 — Integration period bit I13
Type
Pass/Fail
Fault message Integration period bit I13
Description Integration time is set up with I13 and I0 high and all other I lines low. This test uses the same
circuit setup as test 202.1. A reading is acquired and compared to a calculated value based on
the previous reading.
Drawing reference Analog Board; 2002-100
A/D Converter; 2002-160
Components Shift registers that set up the I15 through I0 levels, open or shorted lines components associated
with the I lines, or U816.
Bit pattern* Register
—U400—
01111011
—U811—
00001101
—U224—
00010111
—U432—
10000000
—U810—
00100000
—U206—
01110000
—U203—
10001110
—U411—
11111011
—U809—
00000001
—U207—
00001111
—U221—
11101001
—U406—
00000100
AD_STB
MUX_STB
R1_STB
R2_STB
*Bits associated with register IC terminals as follows:
QQQQQQQQ
87654321 87654321 87654321 87654321
IC pins: Q8=11, Q7=12, Q6=13, Q5=14, Q4=7, Q3=6, Q2=5, Q1=4.