Keysight Technologies 53150A - Self-Test Messages

B Messages
120 Keysight 53150A/151A/152A Operating Guide
Self-Test Messages
Table B-2 lists and describes messages that are generated by the Counter during
Self-Test to indicate whether a component passed or failed its test. These
messages are sent via the RS-232 serial output only—they do not appear on the
Counter’s front-panel display.
Table B-2 Self-Test Messages
Message Description
ROM TEST FAIL
ROM TEST OK
ROM failed read test.
ROM passed read test.
RAM DATA LINES OK
RAM DATA ERROR
RAM ADDR LINES OK
RAM ADDR ERROR
RAM TEST OK
RAM data lines passed test.
RAM data lines failed test.
RAM address lines passed test.
RAM address lines failed test.
RAM tests completed with no errors detected.
EEPROM FAIL - CONFIGURATION DATA
The configuration data saved in EEPROM memory
is defective.
ROM FAIL; Computed checkbyte does not match
the value stored in EEPROM.
The checksum of the ROM data does not match the
value stored in EEPROM.
EEPROM FAIL - CONFIGURATION DATA; Needs to
be (re)initialized.
The EEPROM org code does not verify with current
revision of ROM code.
EEPROM FAIL - POWER CAL DATA; Using default
data
The checksum of the EEPROM power-calibration
table is bad. Factory default calibration data will be
used.
EEPROM FAIL - SAVED SETTINGS; Using default
data
The checksum of the user settings stored in
EEPROM is bad. Factory default settings will be
used.
EEPROM FAIL - SAVED SETTINGS; Invalid EEPROM
SAV n Data.
The checksum of one set of user settings (1 – 9)
stored in EEPROM is bad.
GPIB FAIL; Conf. Test The GP-IB hardware failed its confidence test.