30
Extracting the compressed file produces the following three types of file set.
1. New Application Test definitions
●
Vce(sat)-Ic 2.xtd : Vce and Vbe saturation voltage versus Ic measure-
ment
●
hFE_Vbe-Ic.xtd :hFE and Vbe(on) measurement versus Ic current
●
Ic-Vcbo 2.xtd: Icbo and Vcbo measurement where Vcb sweep stops at
the detection of Vcbo
●
Ic-Vceo_R.xtd: Ic versus Vce measurement using a collector series
resistor to observe breakdown characteristics
●
Ie-Vebo 2.xtd: Iebo and Vebo measurement where Veb sweep stops at
the detection of Vebo
●
Ic-Vces 2.xtd: Ices and Vces measurement where Vce sweep stops at
the detection of Vces
●
Cob.xtd: Cob or Ccb measurement
These new test definitions added to the existing library are all customized for prop-
erly measuring the data sheet specifications of power BJTs.
The new application definitions with “2” (second) extension are added the parame-
ter extraction features and sweep abort setting on detection of breakdown.
Ic-Vceo_R application test supports collector resistor and the voltage drop compen-
sation by the resistance and the collector current.
The other type of new application test definitions are new for measuring the power
BJT device specifications which were not included in the B1505A.
2. Application Test, Classic Test and Tracer Test setup files
●
Example_AT.xpg
The Application Test setups used in this handbook are included in this
file, and they can be imported in your EasyEXPERT as a Preset Group.
●
Example_CT.xpg
The Classic Test or Tracer Test setups used in this handbook are included
in this file, and they can be imported in your EasyEXPERT as a Preset
Group.
All the test setups introduced as the measurement samples in this measurement
handbook can be accessed from the preset group of My Favorite Setup , and you can
work on these files by just changing the measurement parameters or adding neces-
sary modifications to the EasyEXPERT measurement functions,
3. EasyEXPERT example data files
●
EE-PBJT_example.ztr
This file is in a format of compressed test result and it includes the sam-
ple measurement data used in the test example.