82 Keysight CXG, EXG, and MXG X-Series Signal Generators Service Guide
Self Test
Self Test Descriptions
707 User Clock Test (Option 653, 655, 656, or 657)
This test checks the user clock functionality on the A2 Baseband Generator
assembly. The user clock is generated digitally from within DSP and is
recreated with the user clock DAC. The ARB must be turned on for the user
clock to be functional. The user clock rate can go up to 200MHz. However, the
actual frequency of the clock signal that gets generated from the user clock
DAC is between 2MHz and 24MHz. Within the ARB FPGA, the clock signal from
the user clock DAC can be routed to dividers, multipliers, or PLLs to generate
actual user clock. The ARB FPGA also has a counter which is used to measure
the actual frequency of the user clock.
708 Data Path CRC Test (Option 653, 655, 656, or 657)
This test checks the entire ARB data path from the memory through the ARB
FPGA and through the DSP.
800 BB Analog Baseband Self Tests (Model N5166B, N5172B,
N5182B)
The BB Analog Baseband Self Tests are designed to test the analog baseband
section of the A2 Baseband Generator assembly.
801 Internal IQ Offset
This test checks the internal offset DACs for the IQ Modulator.
802 IQ DACs
This test checks the I and Q DAC on the A2 Baseband Generator assembly.
803 External IQ Offset
This test checks the External Out IQ Circuitry of the A2 Baseband Generator
assembly.
804 External In IQ Cal
This test checks the External In IQ Cal Circuitry of the A2 Baseband Generator
assembly.
900 BB RF Self Tests (Model N5166B, N5172B, N5182B)
The BB RF Self Tests are designed to test the RF section of the A2 Baseband
Generator assembly.
901 Prelevel DAC
This test checks the prelevel circuitry on the A2 Baseband Generator assembly.
This circuit sets the LO power that the IQ modulator sees. The LO power is
inversely proportional to the prelevel DAC setting.
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