74 Keysight CXG, EXG, and MXG X-Series Signal Generators Service Guide
Self Test
Self Test Descriptions
Self Test Descriptions
100 Digital Self Tests
The Digital Self Tests are designed to test the digital section of the A3 RF
assembly.
101 Digital FPGA Checks
This test checks the ability to communicate properly with the three FPGAs
situated on the A3 RF assembly. The three FPGAs are the PCIe Bridge FPGA,
the Analog FPGA, and the Reference FPGA.
102 JTAG Chain Check
This test checks the JTAG chain throughout the instrument. The IDCODE for
each part on the chain is read back and compared with what is expected.
103 Digital Voltages
This test checks the voltages used for the digital section.
104 Board Temperature
This test measures different temperature sensors within the A3 RF assembly
and converts the values into degrees Celsius. Also, the largest measured
temperature is subtracted with the smallest measured temperature and
reported back.
105 Sweep Out
This test checks the proper operation of the sweep out circuitry which is
located on the A3 RF assembly.
200 Reference Self Tests
The Reference Self Tests are designed to test the reference section of the A3
RF assembly.
201 Reference Voltages
This test checks the supply voltages used for the reference section.
202 Reference 100MHz Tank DAC
This test checks the MUAT Tank DAC by reporting back the REF MUAT Tank
DAC setting and the 100MHz detected voltage.
203 Reference Tuning Voltage (Internal Ref)
This test measures the tuning voltage of the MUAT oscillator using the internal
10 MHz reference. The MUAT tuning voltage is the output of the reference
phase-lock loop integrator.
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