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Keysight N777 C Series - The Keysight N7779 C Basic Line Step-Tunable Laser Source; O-Band Option for Silicon Photonics; Integrated Photonics Applications; E-Band Option for CWDM8 Component Testing

Keysight N777 C Series
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Keysight N777-C Series Tunable Laser Family User’s Guide 29
Getting Started 2
The Keysight N7779C Basic Line Step-Tunable Laser Source
The new N7779C basic line tunable laser source, like the other new
N777-C models, can step quickly to discrete wavelengths with a resolution
of 0.1 pm and a typical wavelength repeatability of ±3 pm, making it ideal
for cost-effective testing of broadband optical devices. With wavelength
setting times like 300 ms, rapid stepped sweeps are possible. Like the
other lasers in the N777-C family, it delivers more than +12 dBm peak
output power with low spontaneous emission levels. At ±0.01 dB power
stability over an hour, it can also serve as a static local oscillator with a
wide tuning range for receiver testing or transmission experiments.
O-band option for Silicon Photonics/ Integrated Photonics Applications
The N777-C option 113 covers the wavelength range from 1240 nm to
1380 nm for an important set of applications. Equipped with PMF output
fiber, these are a good match for testing and developing components with
Silicon Photonics technology. Verifying the spectral responsivity and the
sensitivity of receiver optical subassemblies (ROSA) for 100G Ethernet
benefit from more than +10 dBm output power - enough to allow for
external modulation in BER testing. Combined with very low SSE levels,
Option 113 is ideal for testing wavelength filters for LR4 components.
E-band option for CWDM8 Component Testing
The N777-C option 114 covers the wavelength range from 1340 nm to
1495 nm. Combined with the other options, this allows measurements
over all CWDM channels, such as for CWDM8 devices. Components for
Raman amplification also use this wavelength range.

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