I
It
It
4. A2CCPU
--------------------
MELSEC·A
(2) Devices which can be sampled
Devices and
the
number of points which can be sampled are indicated
below.
(a) Bit devices (X, Y, M, L, S, F, B,
TIC coil, TIC contact) :
Max. 8 points
(b) Word devices
(TIC present value, D, W, R, A, Z, V) :
Max. 3 points
(3) Number of sampling times
The number of sampling times involves the following two
cases:
total
number of sampling times and the number of sampling times after
the
execution of
the
STRA instruction.
(a) Total number of sampling times
This sets the area where the sampling data is stored.
Selling
is possible in
the
range of 0 to
1024
times (in units of
128
times).
(b) Number of sampling times after the execution of
the
STRA instruc-
tion
This
selling
is used to end the sampling trace and latch the sam-
pling trace data after the execution of the STRA instruction.
Setting is possible in the range of
0 to
1024
times in units of
128
times.
The
number
of sampling times
after the execution of the STRA
s Total number of sampling times s
1024
times
instruction
1 STRA
instruction
executed
I I I
Number of sampling times after
the execution of STRA instruction
Total
number
of sampling times
~
Device
data
is
latched
allar
tha
dasignatad
number of sample times after the execution
of the STRA instruction
Fig.
4.19
Number
of
Sampling
Times
4-31
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