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General| Brand | Omicron |
|---|---|
| Model | CMC 430 |
| Category | Test Equipment |
| Language | English |
Overview of the CMC 430 front panel elements and their functions.
Details of the control interface section, including buttons and LEDs.
Conditions under which the technical specifications are valid.
Specifications for the system clock accuracy and time base.
Information on synchronizing the system clock and output signals.
Details on Ethernet connectivity options for controlling the CMC 430.
Description of the USB ports for computer connection and Wi-Fi adapter.
Description of the control interface section, including buttons, LEDs and ports.
Description of the voltage output section.
Description of the current output section.
Function and use of the Associate button for network connection.
Explanation of the system status indicated by S1 and S2 LEDs.
Conditions under which the technical specifications are valid.
Specifications for the system clock accuracy and time base.
Information on synchronizing the system clock and output signals.
Details on the protection mechanisms for current outputs against overload.
Accuracy specifications for current outputs.
Details on the protection mechanisms for voltage outputs against overload.
Specifications for the analog input mode, including measurement ranges and bandwidth.
Trigger criteria and accuracy for potential sensing mode binary inputs.
Accuracy specifications for DC measurement input in voltage mode.
Accuracy specifications for DC measurement input in current mode.
Specific interface details for ETH, PC, USB, and expansion ports.
Explanation of PoE power sharing between ports.
Specifications for IEC 61850 Sampled Values, including sampling frequency and synchronization.
Specifications for IEC 61850 GOOSE messages, including subscription and performance.
Specifics on transistor outputs for binary outputs 11 to 14, including voltage and current limits.
Information on calibration intervals and traceability for CMC 430 test sets.
Examples illustrating amplifier accuracy calculations under different conditions.
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