Operation Page 45 of 85
2.9 Storing a Test Setup
NOTE:
Instrument PRESET values can be programmed and stored for your specific test setup. Therefore
before storing your tests, program the preset values. Refer to p 2.11 for PRESET programming
information.
To store the previous example of the programmed 5-step test, with the instrument in ‘STAND
BY’ status, press [F3] = MENU to access the memory function.
In MENU with the highlighted box around MEMORY, press [F3] = SELECT to enter the
memory function.
Press [F1] = STORE to access the store function. Press [F2] = DOWN to move highlighted box
to the memory location (1-60) in which you wish to store this test setup. Press [F3] = SELECT
to accept location number.
LAST
DOWN
EXIT
SELECT
RMT ERROFSTLOCKSELECT FUNC.
1
5
4
3
2
MEMORY
KEY LOCK
CALIBRATION
OPTION
SYSTEM
F1
F4
F3
F2
To enter programming mode.
To view/change preset (initial) test
parameters.
To view/change system parameters:
memory, system, option, calibration, key
lock, password, error, & about.
To view the programmed test setups and
access offset function.
PROGRAM
PRESET
MORE..
MENU
RMT ERROFSTLOCKSTAND BY
0.1A
0.5s
1.2
Ω
F1
F4
F3
F2
LOWGCSTEP 1/5 0.3
Ω
:
STAND BY
Display
MENU
To enter MEMORY function.
Return to STAND BY display.
To toggle through MENU functions.
To toggle through MENU functions.
STORE
RECALL
RETURN
DELETE
RMT ERROFSTLOCKSELECT FUNC.
1
5
4
3
2
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
F1
F4
F3
F2
To store a test setup in memory
location 1-60
MEMORY
Return to MENU display.
Delete test in highlighted location.
Recall test in highlighted location.
LAST
DOWN
RETURN
SELECT
RMT ERROFSTLOCKSEL. MEMORY
1
5
4
3
2
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
F1
F4
F3
F2
To move highlighted box to
memory location 60
To select highlighted memory
location and store previously
programmed test setup
Select
LOCATION
To toggle through memory
locations 1-60
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