General Maintenance
Jitter Readout
and Jitter Meter Problems. These measurements are derived from
sampled recovered clock sine wave data. Operation is unlikely to fail if the jitter
waveform display works correctly. The jitter noise floor depends on 3G board
circuits as well as the signal source.
Loop Out Test Signal P roblems. Loop Out Test Signal is available only with
option JIT.
The Loop O ut Test Signal is designed to operate only if either a
3 Gbps signal or no signal is applied to the selected SDI input. The Test Signal
may be momentarily interrupted if an HD, SD, or analog composite signal is
detected at the selected input. The Loop Out Test Signal generation is contained
wholly on the 3 Gbps board.
WFM6120, WFM7020, and WFM7120 Waveform Monitors Service Manual 4–23