Tonghui TH9310 Series - Fail Judgment; Deal with Test Results; Stop; Offset

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instrument, the pulse width is greater than 1mS.
 Zone C: Arc detection circuit. This circuit only samples the mutational amplitude
occurred in the current, signal high pass filters out low frequency → voltage peak
contrast → pulse lock. When the current mutation rise is near the set value, the pulse
width is about 1uS-1mS.
4.4.9 Fail judgment
When the test result exceeds the set limit of the test item or transient current exceeds the
maximum output current the instrument can bear, the instrument will judge the DUT as a failure and
the following results are: the current test is stopped, the voltage output is cut off, and the test result will
be dealt with.
4.4.10 Deal with test results
If existing over limit in the test process, the instrument will judge the DUT as FAIL. There is
mul-test item and the process mode of FAIL judge is controlled by the test mode of the system.
Otherwise, FAIL and the fail reason (HI, as shown in below table) will be displayed and needs
processing by the customer. When the test ends, if there is no FAIL mark, the instrument will judge the
DUT as PASS and the process mode of PASS judge is controlled by PASS HOLD in SYSTEM. The
instrument will transfer to the next test item or it will exit from the test waiting status.
From the beginning of this status to the next item starts high voltage, the customer can use
the software to query the test data and results.
MEAS SETUP
MEAS
SETUP
F1
STEP:
01/01
FUNC:
AC
VOLT:
1.000
kV
UPPR:
1.000
mA
SYSTEM
SETUP
F2
TIME:
0.5
S
LOWR:
OFF
V：
1 . 0 0 0
Kv~
FILE
SETUP
F3
I：
1 . 2 0 0
mA
F4
T:
0 . 0
S
F5
HI FAIL
4.4.11 STOP
In any test mode, if you press down the “STOP” button on the instrument, it will automatically end
the test. When the test ends, no measurement result will be output. But in test end status, customer can
query the test data before pressing the STOP button by using the software.
4.4.12 OFFSET
Before testing, due to the change of working environment and position of the test cable, there may be
some base numbers when the instrument is in no-load test. For some customers who pursuing accurate
measurement can conduct zero clearing in SYSTEM interface. The specific steps are as follows:
1. Set the current test condition in SETUP interface.