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Chapter 6 Service and Repair
Self-Test Procedures
6
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Error Message and Meaning Probable Cause
613 Self-test failed; Chan n, waveform memory not initialized
Waveform RAM for the indicated channel (U1101 or U1102) failed to
initialize.
Main Board
615 Self-test failed; modulation ADC offset too low
Self-test failed; modulation ADC offset too high
This error indicates the internal ADC's measurement of ACOM was out of
limits.
Main Board
616 Self-test failed; modulation ADC reference too low
Self-test failed; modulation ADC reference too high
This error indicates the internal ADC's measurement of its voltage
reference (VRef) was out of limits.
Main Board
620 Self-test failed; Chan n, waveform memory test failed on idle
This error indicates the waveform memory test was not started properly.
Most likely an error in the waveform FPGA (U1005)
Main Board
621 Self-test failed; Chan n, waveform memory test failed
Waveform RAM memory test for the indicated channel (U1101 or U1102)
failed. The memory test consists of writing and reading back the entire
waveform RAM with a predetermined pattern.
Main Board
625 Self-test failed; Chan n, waveform DAC gain[idx] too low
Self-test failed; Chan n, waveform DAC gain[idx] too high
This error indicates that the waveform DAC (U1801 or U1501) output is not
providing the correct output. The gain idx of 1 is the POS voltage test, gain
idx of 2 refers to the NEG voltage test.
Main Board
630 Self-test failed; Chan n, sub attenuator failure 0dB
This error indicates the trim DAC inside the waveform DAC (U1801 or
U1501) is not providing the correct output at the 0dB setting. If this test
fails, the test 631 will not be executed.
Main Board
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