Agilent Technologies 35670A - To select the active trace

Source DC Offset
Measurement Lower
Limit
(mVdc)
Upper Limit
(mVdc)
Measured Value
(mVdc)
Pass/Fail
0 Vdc, 0 Vac(pk) -15 15
-10 Vdc, 0 Vac(pk) -315 315
+10 Vdc, 0 Vac(pk) -315 315
-5 Vdc, 5 Vac(pk) -315 315
+5 Vdc, 5 Vac(pk) -315 315
0 Vdc, 5 Vac(pk) -165 165
Source Flatness
Measurement Lower
Limit
(dB)
Upper Limit
(dB)
Measured Value
(dB)
Pass/Fail
12.8 kHz -1 1
25.6 kHz -1 1
51.2 kHz -1 1
Source Distortion
Measurement Lower
Limit
Upper Limit
(dBc)
Measured Value
(dBc)
Pass/Fail
12.8 kHz -60
51.2 kHz -40
Serial Number:_______________________Report Number:____________________
Test Date:___/___/___
Verifying Specifications Agilent 35670A
Performance Test Record - Four Channel
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