IKONIX Associated Research Hypot III User Manual

9
1.5. Key Features of the HYPOT III
PATENTED SMARTGFI
SmartGFI™ disables the instrument’s output
voltage in less than 1 millisecond if excessive
leakage to ground is detected. If enabled,
SmartGFI™ automatically detects if the DUT is
floating or grounding and turns ON or OFF
accordingly.
10 PROGRAMMABLE
MEMORY LOCATIONS
Each Memory Location can be configured to store
and perform up to 3 test steps. Test steps can be
linked and run in any order for easy touch-and-go
test routines.
DIGITALLY CONTROLLED
ARC DETECTION SYSTEM
Allows the operator to choose whether low-level
arcs should be detected. The operator can select
from multiple sensitivity levels.
PLC REMOTE INPUTS AND
OUTPUTS
Two standard 9 pin interfaces provide inputs and
outputs for simple PLC relay control. Outputs
include: PASS, FAIL, RESET and TEST IN
PROCESS signals. Inputs include: TEST,
INTERLOCK, RESET and remote recall of
MEMORY 1, 2 and 3.
ELECTRONIC RAMPING (UP
& DOWN)
Allows the operator to increase or decrease the
output voltage linearly over a specified period of
time. Minimizes any damage to sensitive DUT’s
from quick high voltage changes.
SEPARATE HIGH AND LOW
LIMIT FAILURE DETECTORS
Allows the operator to create an acceptable
leakage current window. Excessive or minimal
leakage current readings will cause a test failure.
SINGLE STEP FEATURE
Allows the operator to perform multiple test steps
in a Memory Location with one button push, or
requires that the operator initiate each test step in
a Memory Location. User selectable.
CAL-ALERT
Alerts the operator that the machine is due for
calibration in advance of the calibration due date.
PROGRAMMABLE
CONTINUITY TEST WITH
OFFSET
Low current Continuity test may be performed
simultaneously with an AC/DC Hipot test. Passing
the Continuity test is required to continue with
Hipot testing.
VERI-CHEK
Allows the operator to self-verify the instrument’s
failure detectors.
MULTIPLE RESULTS
DISPLAYS
Allows the user to configure the tester to display
results in either Pass/Fail, Last or All conditions.
SECURITY ACCESS
The Lock and Memory Lock features limit operator
access to test setup screens so only authorized
users can configure or change test parameters.

IKONIX Associated Research Hypot III Specifications

General

Brand	IKONIX
Model	Associated Research Hypot III
Category	Measuring Instruments
Language	English