Function and Features
Copyright © ITECH Electronic Co., Ltd. 29
Manual (Def): Manual trigger
External: external signal trigger
Hold: special command trigger
Bus: BUS command trigger
Timer: timer trigger
4. Press [Esc] to exit setting. The system displays original values under
different modes.
3.9 Dynamic test function
Through dynamic test operation, the electronic load can be switched between
two setting parameters based on setting rules. This function can be used to test
dynamic performances of power supply. For dynamic test operation, press
[Tran] key on the front board to enter the dynamic setting menu. Before test,
firstly, set parameters related to dynamic test operation, including dynamic test
mode, A value, B value, pulse width time, frequency, duty ratio, etc. Under CC
mode, current ascending and descending slopes should be set for dynamic
test.
The dynamic test mode can be divided into continuous mode, pulse mode and
toggle mode.
3.9.1 Continuous mode
Under continuous mode, after enabling dynamic test operation, the load will be
switched continuously between A value and B value.
Taking CC mode as example (operations under other modes are similar), when
output voltage and current of the tested instrument are 10V and 3A respectively,
the load current will switch from 1A and 2A. Set the dynamic test parameters
and perform the test as follows:
1. Press [Tran] key. Operate Left/Right key. Move to On and press for
confirmation.
TRANSITION
On Off
2. Select Continuous, Press [Enter] key (The Trig lamp that indicates VFD
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