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JPK instruments nanowizard afm User Manual

JPK instruments nanowizard afm
59 pages
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NanoWizard
®
AFM
Handbook
Version 2.2a
05 / 2012
© 2004-2012 JPK Instruments AG
all rights reserved

Table of Contents

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JPK instruments nanowizard afm Specifications

General IconGeneral
BrandJPK instruments
Modelnanowizard afm
CategoryLaboratory Equipment
LanguageEnglish

Summary

Introduction to Atomic Force Microscopy (AFM)

About This AFM Handbook

Overview of the handbook's scope, content, and target audience for AFM users.

Understanding the Atomic Force Microscope

Explains AFM's fundamental principles, contrasting it with optical microscopy.

AFM Cantilevers Explained

Details the physical components, shapes, and materials of AFM cantilevers.

AFM Imaging Modes and Operation

Feedback and Imaging Control in AFM

Explains feedback loops and height adjustments for image acquisition.

AFM Operation Modes

Details contact and intermittent contact modes of AFM operation.

Phase Imaging for Material Properties

Describes phase imaging and its utility in distinguishing material properties.

Force Spectroscopy: Principles and Applications

Introduction to AFM Force Spectroscopy

Introduces force spectroscopy as a method for sensitive force measurements.

Processing Force Spectroscopy Data

Explains how to process and plot force-distance curve data for analysis.

AFM Cantilever Selection and Calibration

General Cantilever Characteristics

Covers the physical components, shapes, and materials of AFM cantilevers.

Cantilever Types for Imaging Modes

Discusses selecting cantilevers suitable for specific AFM imaging modes.

Calibrating AFM Cantilever Spring Constant

Details methods for calibrating the spring constant of AFM cantilevers.

Cell Imaging with Atomic Force Microscopy

Cell Sample Preparation for AFM

Covers substrate choice, cell attachment, and fixation techniques.

Critical Imaging Parameters for Cell Analysis

Discusses key parameters like cantilever, setpoint, and scan rate for cell imaging.

Optimizing Cell Imaging with the Oscilloscope

Explains using the oscilloscope to optimize imaging parameters for cells.

Single Molecule Imaging Strategies

Key Preparation Steps for Single Molecule Imaging

Emphasizes cleanliness and substrate choice for high-resolution imaging.

Imaging Hints for Intermittent Contact Mode

Provides tips for imaging single molecules in liquid using intermittent contact mode.

Understanding and Mitigating AFM Artifacts

AFM Tip Shape Issues and Artifacts

Explains how tip geometry causes artifacts and affects image quality.

Artifacts from Damaged AFM Tips

Describes artifacts resulting from double tips or worn/damaged probes.

Other Imaging Considerations and Artifacts

Covers interaction forces, tip shape, and sample considerations.

Physics Principles for Scanning Probe Microscopy

Cantilever Resonance and Q-Factor

Explains cantilever resonance behavior and the significance of the Q-factor.

Thermal Noise Spring Constant Calibration Method

Details the thermal noise analysis method for spring constant calibration.

Chemical Preparations for AFM

Cleaning AFM Cantilevers and Tips

Describes methods for cleaning AFM cantilevers and tips for optimal performance.

Silanization and APTES Surface Treatment

Explains surface modification techniques using silanes for substrates and tips.

Home-Made Gel Packs for Cantilever Storage

Provides instructions for creating custom gel packs for storing AFM cantilevers.

AFM References and Resources

General AFM Papers and Articles

Lists general AFM papers for further reading on cell imaging and interactions.

Spring Constant Calibration References

Lists key publications for methods of spring constant calibration.