N
EN 61008 / EN 61009 300 ms 300 ms 150 ms 40 ms
BS 7671 2000 ms 300 ms 150 ms 40 ms
Maximum test times related to selected test current for selective (time-delayed) RCD
Standard
½I
N
EN 61008 / EN 61009 500 ms 500 ms 200 ms 150 ms
BS 7671 2000 ms 500 ms 200 ms 150 ms
Note:
Trip-out limit times for PRCD, PRCD-K and PRCD-S are equal to General (non-
delayed) RCDs.
4.4.4 Z factor
In this menu the Z factor can be set to 0.80
or 1.00.
Figure 4.10: Selection of Z factor
Keys:
UP / DOWN
Sets Z value.
TEST
Confirms Z value.
ESC
Exits back to settings menu.
Function selector
switch
Exits back to selected test / measurement function
without changes.
The impedance limit values for different overcurrent protective devices can be scaled
down by a factor 0,8 (Z factor). This means that the fault current will still be high
enough at increased conductor temperatures and low supply voltages. This assures
safe operation of the overcurrent protection device in all conditions.
See Appendix A Impedance tables for lists of the impedance limit values for the
various overcurrent protection devices.
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