MARTINDALE ET4500 - RCD Trip-Out Time (RCDt) Measurement; Trip-Out Time Measurement Procedure; RCD Trip-Out Current (RCD I) Measurement

Martindale ET4000 / ET4500 Measurements
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5.4.2 Trip-out time (RCDt)
Trip-out time measurement verifies the sensitivity of the RCD at different residual
currents.
Trip-out time measurement procedure
 Select the RCD function using the function selector switch.
 Set sub-function to RCDt using UP / DOWN keys.
 Set test parameters (if required).
 Connect the test leads to the instrument.
 Connect the test leads to the wiring of the RCD to be tested (see Figure 5.19).
 Press the TEST key to perform the measurement.
 Store the result, if requred, by pressing the MEM key (ET4500 only).
Figure 5.21: Example of trip-out time measurement results
Displayed results:
t ........... trip-out time
Uc........ contact voltage for rated I

N
5.4.3 Trip-out current (RCD I)
A continuously rising residual current is used for testing the threshold sensitivity of RCD
trip-out. The instrument increases the test current in small steps through the appropriate
range as follows:
RCD type
Slope range
Waveform Notes
Start value End value
AC
0.2I

N
1.1I

N
Sine All models
A, F (I

N
 30 mA) 0.2I

N
1.5I

N
Pulsed
A, F (I

N
= 10 mA) 0.2I

N
2.2I

N
Maximum test current is I

(trip-out current) or the end value when the RCD does not
trip-out.
Trip-out current measurement procedure
 Select the RCD function using the function selector switch.
 Set sub-function to RCD I using UP / DOWN keys.
 Set test parameters (if necessary).
 Connect the test leads to the instrument.
 Connect the test leads to the wiring of the RCD to be tested (see Figure 5.19).
 Press the TEST key to perform the measurement.
 Store the result, if required, by pressing the MEM key (ET4500 only).