RM46L852
SPNS185 –SEPTEMBER 2012
www.ti.com
4.13 On-Chip SRAM Initialization and Testing
4.13.1 On-Chip SRAM Self-Test Using PBIST
4.13.1.1 Features
• Extensive instruction set to support various memory test algorithms
• ROM-based algorithms allow application to run TI production-level memory tests
• Independent testing of all on-chip SRAM
4.13.1.2 PBIST RAM Groups
Table 4-26. PBIST RAM Grouping
Test Pattern (Algorithm)
March 13N
(1)
March 13N
(1)
triple read triple read
two port single port
Memory RAM Group Test Clock MEM Type slow read fast read
(cycles) (cycles)
ALGO MASK ALGO MASK ALGO MASK ALGO MASK
0x1 0x2 0x4 0x8
PBIST_ROM 1 ROM CLK ROM X X
STC_ROM 2 ROM CLK ROM X X
DCAN1 3 VCLK Dual Port 25200
DCAN2 4 VCLK Dual Port 25200
DCAN3 5 VCLK Dual Port 25200
ESRAM1 6 HCLK Single Port 266280
MIBSPI1 7 VCLK Dual Port 33440
MIBSPI3 8 VCLK Dual Port 33440
MIBSPI5 9 VCLK Dual Port 33440
VIM 10 VCLK Dual Port 12560
MIBADC1 11 VCLK Dual Port 4200
DMA 12 HCLK Dual Port 18960
N2HET1 13 VCLK Dual Port 31680
HET TU1 14 VCLK Dual Port 6480
MIBADC2 18 VCLK Dual Port 4200
N2HET2 19 VCLK Dual Port 31680
HET TU2 20 VCLK Dual Port 6480
ESRAM5 21 HCLK Single Port 266280
ESRAM6 22 HCLK Single Port 266280
23 8700
Dual Port
ETHERNET 24 VCLK3 6360
25 Single Port 133160
26 Dual Port 4240
USB VCLK3
27 Single Port 66600
(1) There are several memory testing algorithms stored in the PBIST ROM. However, TI recommends the March13N algorithm for
application testing.
The PBIST ROM clock frequency is limited to 100MHz, if 100MHz < HCLK <= HCLKmax, or HCLK, if
HCLK <= 100MHz.
The PBIST ROM clock is divided down from HCLK. The divider is selected by programming the ROM_DIV
field of the Memory Self-Test Global Control Register (MSTGCR) at address 0xFFFFFF58.
86 System Information and Electrical Specifications Copyright © 2012, Texas Instruments Incorporated
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