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SIF5600 - Manual - 03 - 2008
Self-test
The following informations concerning to the SELF TEST function are available:
Self test None Type of anomaly (e.g.: NONE)
Self-test cause 0000 hex Cause of anomaly (e.g.: NONE)
Self-test latched 0000 hex Cause of anomaly stored (e.g.: NONE)
The meaning of the variable expressed in hexadecimal notation is reported in the following table:
bit 0 Stack overflow
bit 1 reserved
bit 2 Eeprom overflow
bit 3 Eeprom CAL fail
bit 4 Eeprom PAR fail
bit 5 Eeprom REE fail
bit 6 reserved
bit 7 reserved
bit 8 HW Fail
bit 9 Coil Fail
bit 10 PW break Blin1
bit 11 reserved
bit 12 PW shorted
bit 13 CB fail
Since information relating to diagnostics is reset when the cause is cleared, for the purpose of in-
dicating transient anomalies, a suitable register has been arranged where the data may be perma-
nently stored (latched).
It is possible to view the status of the diagnostics with the details of the cause which has lead to the
anomaly, by clicking the mouse while the cursor positioned over the corresponding field.
Self-test latched
0000 hex
Information are stored until activation of the RESET command.
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