Agilent Technologies E4440A User Manual

106 Chapter 2
Instrument Functions: A - L
Display
Instrument Functions: A - L
NOTE If two amplitude values are entered for the same frequency, a single vertical line is
the result. In this case, if an upper line is chosen, the amplitude of lesser frequency
(amplitude 1) is tested. If a lower line is chosen, the amplitude of greater frequency
(amplitude 2) is tested.
For linear amplitude interpolation and linear frequency interpolation, the
interpolation is computed as:
For linear amplitude interpolation and log frequency interpolation, the interpolation
is computed as:
For log amplitude interpolation and linear frequency interpolation, the interpolation
is computed as:
For log amplitude interpolation and log frequency interpolation, the interpolation is
computed as:
Key Path: Display, Limits, Limit 1
Display
, Limits, Limit 2
State Saved: Persistent; retains settings, even through a power cycle.
Factory Preset
and *RST: Log
History: Added with firmware revision A.03.00
Remote Command:
:CALCulate:LLINe[1]|2:CONTrol:INTerpolate:TYPE LOGarithmic|LINear
:CALCulate:LLINe[1]|2:CONTrol:INTerpolate:TYPE?
Example: :CALC:LLIN2:CONT:INT:TYPE LIN sets limit line 2 frequency
interpolation to linear.
y
y
i1+
y
i
–
f
i1+
f
i
–
----------------------
ff
i
–()y
i
+=
y
y
i1+
y
i
–
log f
i1+
log f
i
–
---------------------------------------
log f log f
i
–()y
i
+=
log y
log y
i1+
log y
i
–
f
i1+
f
i
–
-----------------------------------------
ff
i
–()log y
i
+=
log y
log y
i1+
log y
i
–
log f
i1+
log f
i
–
-----------------------------------------
log f log f
i
–()ylog
i
+=

Agilent Technologies E4440A Specifications

General

Brand	Agilent Technologies
Model	E4440A
Category	Measuring Instruments
Language	English

Summary

2. Instrument Functions: A - L

2.1 AMPLITUDE / Y Scale

Controls display of amplitude data, including reference level and scaling.

2.7 FREQUENCY / Channel

2.8 Input/Output

3. Instrument Functions: M - O

3.1 Marker

Controls marker functions for measuring trace data points.

3.4 MEASURE (Spectrum Analysis Mode)

Provides access to measurement setup and configuration options.

3.6 MODE and Mode Setup

4. Instrument Functions: P - Z

4.1 Peak Search

Locates and analyzes peaks on the trace based on defined parameters.

4.2 Preset

4.5 Save

Saves analyzer states, traces, and screen data to storage.

4.7 SPAN / X Scale

Adjusts the displayed frequency range and X-axis scale.

4.8 SWEEP

Controls sweep time and mode for signal acquisition.

4.9 System

5. Programming Fundamentals

SCPI Language Basics

Introduces the SCPI programming language, keywords, syntax, and parameters.

Improving Measurement Speed

Provides techniques to optimize program execution and measurement speed.

Programming Command Compatibility Across Model Numbers and Across Modes

Using the LAN to Control the Instrument

Explains how to control the instrument using LAN connectivity.

Programming in C Using the VTL

6. Using the STATus System

Using the Status Registers

Common Using the STATus System IEEE Commands

STATus Subsystem

Explains the SCPI-defined instrument-status reporting structures and registers.

7. Menu Maps: Spectrum Analysis

FREQUENCY Channel Key (See page 143)

Input/Output Key (See page 151)

Marker Key (See page 167)

Details the menu structure for controlling marker functions on the trace.

Marker --> Key (See page 185)

Marker Fctn Key (See page 179)

MODE Key (See page 195)

Peak Search Key (See page 203)

Shows the menu flow for performing peak searches on trace data.

Preset Key (See page 211)

Print Setup Key (See page 215)

SPAN X Scale Key (See page 227)

Details the menu structure for adjusting span and X-axis scale.

Sweep Key (See page 231)

Shows the menu paths for controlling sweep time and mode.

System Key, 1 of 4 (See page 241)

Trace/View Key (See page 277)

Trig Key (See page 281)

Details the menu paths for setting trigger conditions for sweeps and measurements.