Agilent Technologies E4440A User Manual

Chapter 3 185
Instrument Functions: M - O
Marker ->
Instrument Functions: M - O
3.3 Marker ->
Accesses menu keys that can copy the current marker value into other instrument
parameters (for example,
Center Frequency).
3.3.1 Mkr->CF
Sets the center frequency of the analyzer to the frequency of the selected marker. The
marker stays at this frequency, so it moves to the center of the display. This function is not
available in
Zero Span.
Key Path:
Marker ->
Remote Command:
:CALCulate:MARKer[1]|2|3|4[:SET]:CENTer
Example: CALC:MARK2:CENT sets the CF of the analyzer to the value of marker 2.
3.3.2 Mkr->CF Step
Sets the center frequency (CF) step size of the analyzer to the marker frequency, or in a
delta-marker mode, to the frequency difference between the delta and reference markers.
The step size can be verified by pressing
Frequency, Center Freq. The step size is displayed
in the third line of the active function area of the display. This function is not available in
Zero Span.
Key Path:
Marker ->
Remote Command:
:CALCulate:MARKer[1]|2|3|4[:SET]:STEP
Example: CALC:MARK1:STEP sets the CF step to the value (or delta value) of marker
1.

Agilent Technologies E4440A Specifications

General

Brand	Agilent Technologies
Model	E4440A
Category	Measuring Instruments
Language	English

Summary

2. Instrument Functions: A - L

2.1 AMPLITUDE / Y Scale

Controls display of amplitude data, including reference level and scaling.

2.7 FREQUENCY / Channel

2.8 Input/Output

3. Instrument Functions: M - O

3.1 Marker

Controls marker functions for measuring trace data points.

3.4 MEASURE (Spectrum Analysis Mode)

Provides access to measurement setup and configuration options.

3.6 MODE and Mode Setup

4. Instrument Functions: P - Z

4.1 Peak Search

Locates and analyzes peaks on the trace based on defined parameters.

4.2 Preset

4.5 Save

Saves analyzer states, traces, and screen data to storage.

4.7 SPAN / X Scale

Adjusts the displayed frequency range and X-axis scale.

4.8 SWEEP

Controls sweep time and mode for signal acquisition.

4.9 System

5. Programming Fundamentals

SCPI Language Basics

Introduces the SCPI programming language, keywords, syntax, and parameters.

Improving Measurement Speed

Provides techniques to optimize program execution and measurement speed.

Programming Command Compatibility Across Model Numbers and Across Modes

Using the LAN to Control the Instrument

Explains how to control the instrument using LAN connectivity.

Programming in C Using the VTL

6. Using the STATus System

Using the Status Registers

Common Using the STATus System IEEE Commands

STATus Subsystem

Explains the SCPI-defined instrument-status reporting structures and registers.

7. Menu Maps: Spectrum Analysis

FREQUENCY Channel Key (See page 143)

Input/Output Key (See page 151)

Marker Key (See page 167)

Details the menu structure for controlling marker functions on the trace.

Marker --> Key (See page 185)

Marker Fctn Key (See page 179)

MODE Key (See page 195)

Peak Search Key (See page 203)

Shows the menu flow for performing peak searches on trace data.

Preset Key (See page 211)

Print Setup Key (See page 215)

SPAN X Scale Key (See page 227)

Details the menu structure for adjusting span and X-axis scale.

Sweep Key (See page 231)

Shows the menu paths for controlling sweep time and mode.

System Key, 1 of 4 (See page 241)

Trace/View Key (See page 277)

Trig Key (See page 281)

Details the menu paths for setting trigger conditions for sweeps and measurements.