Agilent Technologies E4440A User Manual

Chapter 3 175
Instrument Functions: M - O
Marker
Instrument Functions: M - O
3.1.7 Marker Trace
Selects the trace that you want your marker or marker pair to be placed on. You can pick
Marker Trace 1, 2, or 3, or Auto. In Auto mode, the analyzer places markers on the
lowest-numbered trace that is in
Clear Write mode. If no trace is in Clear Write mode, it
places the marker on the lowest-numbered trace in
Max Hold mode. If there are none, then
it uses the lowest-number trace in
Min Hold mode, then in View mode. For example, if trace
1 is in view, and trace 2 is in clear write, any new marker is assigned to trace 2.
Key Path:
Marker
State Saved: The Marker Trace for each marker is saved in instrument state.
Factory Preset: Auto on, Trace 1
Range: 1 to 3
Remote Command:
:CALCulate:MARKer[1]|2|3|4:TRACe 1|2|3
Puts the marker on the specified trace and turns
Auto OFF for that marker.
:CALCulate:MARKer[1]|2|3|4:TRACe?
The query returns the number of the trace on which the marker currently resides, even if
that marker is in
Auto mode.
:CALCulate:MARKer[1]|2|3|4:TRACe:AUTO OFF|ON|0|1
Turning
Auto off sets the Marker Trace value to the number of the trace on which the
marker currently resides.
:CALCulate:MARKer[1]|2|3|4:TRACe:AUTO?
The response to the query will be 0 if OFF, 1 if ON.
Example: CALC:MARK1:TRAC 2 places marker 1 on trace 2.

Agilent Technologies E4440A Specifications

General

Brand	Agilent Technologies
Model	E4440A
Category	Measuring Instruments
Language	English

Summary

2. Instrument Functions: A - L

2.1 AMPLITUDE / Y Scale

Controls display of amplitude data, including reference level and scaling.

2.7 FREQUENCY / Channel

2.8 Input/Output

3. Instrument Functions: M - O

3.1 Marker

Controls marker functions for measuring trace data points.

3.4 MEASURE (Spectrum Analysis Mode)

Provides access to measurement setup and configuration options.

3.6 MODE and Mode Setup

4. Instrument Functions: P - Z

4.1 Peak Search

Locates and analyzes peaks on the trace based on defined parameters.

4.2 Preset

4.5 Save

Saves analyzer states, traces, and screen data to storage.

4.7 SPAN / X Scale

Adjusts the displayed frequency range and X-axis scale.

4.8 SWEEP

Controls sweep time and mode for signal acquisition.

4.9 System

5. Programming Fundamentals

SCPI Language Basics

Introduces the SCPI programming language, keywords, syntax, and parameters.

Improving Measurement Speed

Provides techniques to optimize program execution and measurement speed.

Programming Command Compatibility Across Model Numbers and Across Modes

Using the LAN to Control the Instrument

Explains how to control the instrument using LAN connectivity.

Programming in C Using the VTL

6. Using the STATus System

Using the Status Registers

Common Using the STATus System IEEE Commands

STATus Subsystem

Explains the SCPI-defined instrument-status reporting structures and registers.

7. Menu Maps: Spectrum Analysis

FREQUENCY Channel Key (See page 143)

Input/Output Key (See page 151)

Marker Key (See page 167)

Details the menu structure for controlling marker functions on the trace.

Marker --> Key (See page 185)

Marker Fctn Key (See page 179)

MODE Key (See page 195)

Peak Search Key (See page 203)

Shows the menu flow for performing peak searches on trace data.

Preset Key (See page 211)

Print Setup Key (See page 215)

SPAN X Scale Key (See page 227)

Details the menu structure for adjusting span and X-axis scale.

Sweep Key (See page 231)

Shows the menu paths for controlling sweep time and mode.

System Key, 1 of 4 (See page 241)

Trace/View Key (See page 277)

Trig Key (See page 281)

Details the menu paths for setting trigger conditions for sweeps and measurements.