XS series operating manual
XS user manual v0.55 - 21 -
Detection of capacitive samples
Before starting a test, it is possible to detect whether the sample is properly connected to the unit or not.
This is possible provided that the sample to test has a capacitive value of at least 10nF. If the detection
is activated, a pulse of 100V magnitude and of 1s duration is generated, right before the hipot test starts.
The capacity value is deduced from the current measured during this pulse. If the capacity value
deduced is high enough, the sample is considered detected and the test continues. Otherwise, the test is
stopped, and the hipot voltage is not generated.
By default, the detection threshold is set to 10nF. When the EXPERT mode is activated, it is possible to
configure this detection threshold between 5nF and 10nF by 1nF steps and between 10nF and 1000nF
by 10nF steps.
Precision on the detection threshold : ±40%
Ex: To detect samples of at least 10nF capacitive value, a threshold of at least 10nF(1-40%)=5nF should
be set to ensure that the absence/presence of the sample will be detected every time. Likewise, a
detection threshold of 10nF ensures the detection of absence/presence of samples with capacitive
values of at least 10nF/(60%) = 17nF.
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