Manufacturer's Declaration Proline Promag 300 HART
6 Endress+Hauser
SIL integrity
Systematic safety integrity SIL 2 capable SIL 3 capable
Hardware safety integrity Single-channel service
(HFT = 0)
SIL 2 capable SIL 3 capable
Multi-channel service
(HFT ≥ 1)
SIL 2 capable SIL 3 capable
FMEDA
Safety function(s) Min., Max., Range
Device model A1 A2
Option BA, BB Option CA, CB Option BA, BB Option CA, CB, CC
λ
DU
1)
132 FIT 128 FIT 152 FIT 148 FIT
λ
DD
1647 FIT 1627 FIT 2338 FIT 2317 FIT
λ
SU
1528 FIT 1724 FIT 1744 FIT 1940 FIT
λ
SD
1240 FIT 1226 FIT 2022 FIT 2009 FIT
SFF - Safe Failure Fraction 97 % 97 %
PFD
avg
for T
1
= 1 year
2)
(single-channel architecture)
5.8 · 10
-4
5.6 · 10
-4
6.6 · 10
-4
6.5 · 10
-4
PFD
avg
for T
1
= 4 years
(single-channel architecture)
2.3 · 10
-3
2.6 · 10
-3
PFH 6.6 · 10
-8
6.4 · 10
-8
7.6 · 10
-4
7.4 · 10
-4
PTC
3)
Up to 99 % Up to 99 %
MTBF
tot
4)
69 years 58 years 69 years 57 years
Diagnostic test interval
5)
30 min 30 min
Fault response time
6)
30 s 30 s
Process safety time
7)
50 h 50 h
Recommended test interval T
1
4 years 3 years
MTTF
d
8)
64 years 65 years 45 years 46 years
1)
FIT = Failure In Time, number of failures per 10
9
h.
2) Valid for averaged ambient temperatures up to 40 °C (104 °F) in accordance with general standard for devices
with SIL capability.
3) PTC = Proof Test Coverage (diagnostic coverage achieved by device failure detection during manual proof testing).
4) This value takes into account all failure types of the electronic components as per Siemens SN29500.
5) All diagnostic functions are carried out at least once during this time.
6) Maximum time between fault detection and fault response.
7) The process safety time amounts to the diagnostic test interval * 100 (calculation as per IEC 61508).
8) MTTF
d
as per ISO 13849/IEC 62061 also includes soft errors (sporadic bit errors in data memories).