Epson AcuLaser C2900N - DRAM Test; EEPROM Test; MAC+PHY Test

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Chapter 2 Operation of Diagnostic
Epson AcuLaser C2900N
Revision B
Confidential
4.1.4 EEPROM Test
Performs write/read/verify on the diag. area of the EEPROM.
Executes this test when the 116-323,116-324 and 116-390 errors occurred.
Test result: NG (Go to each FIP.) OK (Turn off/on the main power.)
The test performs read/write/verify of the test patterns (0xff,0xaa, 0x55 and 0x00) on one byte at every
0x400 from the first address of EEPROM.
4.1.5 DRAM Test
Tests OPEN/SHORT with the address line of the DRAM.
Performs write/read/verify on the entire DRAM.
Executes this test when the 116-315, 116-316 and 116-320 errors occurred.
Test result: NG (Go to each FIP.) OK (Turn off/on the main power.)
When the optional DRAM SIMM is checked and found, it checks the optional memory area.
First, the test performs read/write/verify of the increment data for the whole tested area by the word.
Then, it performs read/write/verify of the test patterns (0xffffffff, 0xaaaaaaaa, 0x55555555,
0x00000000) for the whole tested area by the word.
4.1.6 MAC+PHY Test
MAC: Media Access Control
PHY: Physical Layer
PHY Internal loopback test
Executes this test when the 116-314, 016-350, 116-351, 116-352 and 116-355 errors occurred.
Test result: NG (Go to each FIP.) OK (Turn off/on the main power.)
PHY Internal loopback test
Normal Error
CHECK OK EEPROM ID* ERROR (*:1,2)
Normal Error
CHECK OK DRAM slot* ERROR (*:0,1)
Normal Error
CHECK OK MAC+PHY ERROR